QTL mapping of seedling and field resistance to stem rust in DAKIYE/Reichenbachii durum wheat population

Stem rust
DOI: 10.1371/journal.pone.0273993 Publication Date: 2022-10-06T17:34:15Z
ABSTRACT
Stem rust caused by the fungus Puccinia graminis f.sp. tritici Eriks. & E. Henn. ( Pgt ) threatens global production of both durum wheat Triticum t urgidum L. ssp. (Desf.) Husnot and common aestivum L.). The objective this study was to evaluate a recombinant inbred line (RIL) population from cross between susceptible parent ‘DAKIYE’ resistant ‘Reichenbachii’ developed International Center for Improvement Maize Wheat (CIMMYT) 1) seedling response races JRCQC TTRTF 2) field bulk current prevalent in Ethiopia Kenya 3) map loci associated with resistances population. A total 224 RILs along their parents were evaluated at stage Ethiopian Institute Agricultural Research greenhouse Debre Zeit, EIAR KALRO fields Kenya, two seasons 2019 2020. lines genotyped using genotyping-by-sequencing approach. 843 single nucleotide polymorphism markers 175 used quantitative trait locus (QTL) analyses. Composite interval mapping (CIM) identified three QTL on chromosomes 3B, 4B 7B contributed parent. chromosome 3B all growth stages it explained 11.8%, 6.5%, 6.4% 15.3% phenotypic variation responses JRCQC, trials ETMS19 KNMS19, respectively. power identify additional limited number high-quality markers, since several segregation distortion eliminated. cytological is needed understand presence chromosomal rearrangements. Future evaluations RIL families identification durable adult plant resistance sources crucial breeding stem future.
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