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Novel nanosample preparation with a helium ion microscope

Field ion microscope
DOI: 10.1557/jmr.2013.30 Publication Date: 2013-04-03T17:07:52Z
Abstract Supplemental Material References Cited by
AUTHORS (5)
Maria Rudneva
Emile van Veldhoven
Sairam K. Malladi
Diederik Maas
Henny W. Zandbergen
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