Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations

• DOI: 10.1557/jmr.2018.375
• Publication Date: 2018-11-06T09:58:31Z
• Authors: Baptiste Gault; Andrew J. Breen; Yanhong Chang; Junyang He; Eric A. Jägle; Paraskevas Kontis; Philipp Kürnsteiner; Alisson Kwiatkows...; Surendra Kumar Ma...; Isabelle Mouton; Zirong Peng; Dirk Ponge; Torsten Schwarz; Leigh T. Stephenson; Agnieszka Szczepa...; Huan Zhao; Dierk Raabe
• Keywords: Atom probe; Atomic units

Abstract