Login

High-resolution direct-write patterning using focused ion beams

DOI: 10.1557/mrs.2014.56 Publication Date: 2014-04-09T13:53:35Z
Abstract Supplemental Material References Cited by
AUTHORS (3)
Leonidas E. Ocola
Chad Rue
Diederik Maas
ABSTRACT
Abstract
SUPPLEMENTAL MATERIAL
Coming soon ....
REFERENCES (45)
CITATIONS (34)
EXTERNAL LINKS
OPENAIRE - Products  CROSSREF - Publications 
PlumX Metrics
RECOMMENDATIONS
FAIR ASSESSMENT
Coming soon ....
JUPYTER LAB
Coming soon ....