A novel self-recoverable and triple nodes upset resilience DICE latch

• DOI: 10.1587/elex.15.20180753
• Publication Date: 2018-09-05T18:24:00Z
• Authors: Dianpeng Lin; Yiran Xu; Xiaoyun Li; Xin Xie; Jianwei Jiang; Jiangchuan Ren; Huilong Zhu; Zhengxuan Zhang; Shichang Zou
• Keywords: Single event upset; Upset; Dice; Soft error; Resilience

With the CMOS technology scaling down, normal latch is more susceptible to soft errors caused by radiation particles. In this paper, we proposed a low-power and highly reliable hardened enhance single event upset (SEU) tolerance. Based on DICE Muller C-element circuit, can provide 100% fault tolerance, which be used for space applications in severe ray environments. The simulation show that's it not only completely tolerate an SEU any one of its internal node, but also double-node triple-node upsets protection facultative initial state latch. What's more, compared with other latches, cell has comparable or better performance matter delay time power.