Self Synchronous Circuits for Robust Operation in Low Voltage and Soft Error Prone Environments

• DOI: 10.1587/transele.e96.c.518
• Publication Date: 2013-03-31T22:38:32Z
• Authors: Benjamin DEVLIN; Makoto IKEDA; Kunihiro ASADA
• Keywords: 0202 electrical engineering, electronic engineering, information engineering; 02 engineering and technology