Phase Analysis Primer: How to Select the Right Analytical Technique

• DOI: 10.31399/asm.amp.2023-01.p032
• Publication Date: 2023-08-23T08:34:46Z
• Authors: Rajan Bhambroo
• Keywords: Metallography; Atom probe

This article reviews the analytical techniques used for phase identification in components, including x-ray diffraction, metallography/microscopy, electron backscatter trasmission microscopy,and atom probe tomography. The addresses advantages and disadvantages of each technique compared to other approaches.