Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy

• DOI: 10.3390/s19204510
• Publication Date: 2019-10-17T15:07:59Z
• Authors: Omur E. Dagdeviren; Yoichi Miyahara; Aaron Mascaro; Tyler Enright; Peter Grütter
• Keywords: Oscillation (cell signaling); Scanning Probe Microscopy

With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying local tip-sample interaction potentials. Such quantitative experiments using noncontact frequency modulation force based on accurate measurement resonance shift due interaction. Here, we experimentally show that oscillating probes used for SPM change systematically as a function oscillation amplitude under typical operating conditions. This not interactions, but rather cantilever strain or geometric effects thus amplitude. Our numerical calculations demonstrate dependence an additional yet overlooked systematic error source can result nonnegligible errors measured potentials forces. experimental results complementary reveal this needs be corrected even with active control able quantify forces milli-electron volt pico-Newton resolutions.