Research on the Degradation Model of the Clamping Device Based on CAE Simulation and Data-driven

• DOI: 10.36001/phmap.2017.v1i1.1850
• Publication Date: 2024-03-24T03:13:42Z
• Authors: Yu Li; Kang Rui; Zhang Bin; Wang Yansong
• Keywords: Degradation

The paper is based on PHM oriented design and modeling of durability testing for clamping devices. scheme made out through the Computer Aided Engineering (CAE) simulation result degradation model studied by Data-driven according to test data. Based analysis main failure mode mechanism, it concluded that reason device cracking fatigue which caused cycle force. conducted CAE analysis, strain data have been collected NI acquisition equipment. data, method used high-cycle And with comparison among different regression models, we selected appropriate one will provide theoretical support management similar machines. In applications, updating this actual target device, can monitor health state predict remaining service life device. So actively predictive maintenance be done avoided.