Exploring Dependence of Rapid Thermal Annealed Ag/ITO Bilayer Films Properties on the Systematic Ag Layer Thickness Increment for Bifacial CZTS Solar Cell Application

• DOI: 10.4314/tjs.v50i4.14
• Publication Date: 2024-12-12T20:11:17Z
• Authors: Emmanuel R Ollotu; Justine Nyarige; Margaret E Samiji; Nuru R Mlyuka; Mmantsae Diale

This study investigated the impact of Ag layer thickness on properties rapid thermal annealed Ag/ITO bilayer films, aimed at addressing conductivity loss in ITO substrates used as a back contact for optoelectronic applications, such bifacial CZTS solar cells. layers varying (10 nm, 20 30 and 40 nm) were sputter-deposited onto commercially acquired ITO-coated glass substrate rapidly thermally annealed. The samples’ characterization was performed using AFM, XRD, four-point probe, Hall Effect measurements, UV-VIS-NIR spectrophotometry. Results indicated that thinner exhibited relatively stable surfaces with uniformly distributed grains, smaller roughness, higher electrical due to increased carrier mobility concentration. XRD analysis showed preferential delafossite AgInO₂ structure layers. Optical measurements revealed sample had lower transmittance bandgap narrowing, while thicker broadening. samples bandgaps within reported (3.38 4.15 eV). films achieved high average 76%, sheet resistance enhanced micro-strain crystallite size properties. These results suggest hold potential use particularly contacts