In-situ characterization of qubit drive-phase distortions

• DOI: 10.48550/arxiv.2309.14703
• Publication Date: 2023-01-01
• Authors: Mario F. Gely; J.M.A. Litarowicz; A. D. Leu; David Lucas
• Keywords: Characterization

Reducing errors in quantum gates is critical to the development of computers. To do so, any distortions control signals should be identified, however, conventional tools are not always applicable when part system under high vacuum, cryogenic, or microscopic. Here, we demonstrate a method detect and compensate for amplitude-dependent phase changes, using qubit itself as probe. The technique implemented microwave-driven trapped ion qubit, where correcting leads three-fold improvement single-qubit gate error, attain state-of-the-art performance benchmarked at $1.6(4)\times 10^{-6}$ error per Clifford gate.