Measurement induced phase transitions in quantum raise and peel models

• DOI: 10.48550/arxiv.2402.08605
• Publication Date: 2024-02-13
• Authors: Eliot Heinrich; Xiaohong Chen
• Keywords: Quantum Physics; Statistical Mechanics (cond-mat.stat-mech); FOS: Physical sciences; Quantum Physics (quant-ph); Condensed Matter - Statistical Mechanics

We present a quantum circuit model which emulates the interface growth of classical raise-and-peel model. Our consists Clifford unitary gates interspersed with projective measurements, applied according to prescribed feedback rules. numerically find via large-scale simulations that, depending on rules, system may undergo several measurement-induced entanglement transitions, including continuous transitions within universality class not previously observed in hybrid random systems as well first-order transition.