Multi-Mode Lens for Momentum Microscopy and XPEEM: Theory

• DOI: 10.48550/arxiv.2408.10104
• Publication Date: 2024-08-19
• Authors: Olena Tkach; G. Schoenhense
• Keywords: Momentum (technical analysis); Mode (computer interface); Through-the-lens metering

The strong electric field between the sample and extractor is core of cathode lenses a pivotal determinant high resolution. Nevertheless, fields in range 3-8 kV/mm can be source complications. Local enhancement at sharp edges or microscopic protrusions cleaved samples may result emission flashovers. Moreover, slow background electrons are drawn into microscope column, where they contribute to space charge effects. A novel front lens configuration, optimized through ray-tracing simulations, significantly reduces allows even for zero retarding field, which serves suppress One several annular electrodes, situated concentric position relative extractor, serve form an additional within gap extractor. refractory power this lens, consequently surface, modified by adjusting potentials electrodes. imaging properties aberrations have been investigated with regard momentum XPEEM. study encompasses energy from few-eV level laser-ARPES 6 keV, hard X-ray ARPES. converging close proximity exhibits reduced curvature k-image backfocal plane. This acquisition larger view both real-space imaging.