Path of Technology Opportunity Identification based on Outlier Patents

• DOI: 10.62051/ijsspa.v6n2.23
• Publication Date: 2025-03-17T09:48:32Z
• Authors: Zilong Zhao
• Keywords: Identification

Given that the important information of technological innovation contained in outlier patents can provide first-hand data for enterprises to carry out activities efficiently, we rely on multi-dimensional map construct a path identify opportunities based patents. [Methods]Firstly, BERT-LOF algorithm (Local Outlier Factor) is used extract candidate patents, and entropy weight method assign weights indicators novelty, scope application, development capability calculate comprehensive assessment value so as filter with potential value; secondly, BERTopic theme modeling technique technology from Secondly, themes elements are divided into dimensions map, which then coupled multiple laws figurative opportunities; lastly, 3D printing taken an example illustrate process application this opportunity identification pathway. [Significance] detection model effectively improve extraction accuracy its scientific decision-making reference basis efficiency reduce costs.