A5101838881- Force Microscopy Techniques and Applications
- Advanced Sensor and Energy Harvesting Materials
- Mechanical and Optical Resonators
- Conducting polymers and applications
- Analytical Chemistry and Sensors
- Advanced Surface Polishing Techniques
- Advanced Fiber Optic Sensors
- Advanced MEMS and NEMS Technologies
- Innovative Energy Harvesting Technologies
- Muscle activation and electromyography studies
- Adhesion, Friction, and Surface Interactions
- Tactile and Sensory Interactions
- Non-Destructive Testing Techniques
- Thin-Film Transistor Technologies
- Geophysics and Sensor Technology
- Surface Roughness and Optical Measurements
- Silicon and Solar Cell Technologies
- Near-Field Optical Microscopy
- solar cell performance optimization
- Advanced Measurement and Metrology Techniques
Chongqing University of Science and Technology
2011-2023
North China University of Technology
2019
Tohoku University
2013
The self-cleaning technology for solar cell array can promote efficiency of electricity produced and protect the cell. methods dust-removal, such as natural means, mechanical nano-film, electrostatic means are presented in this paper. It is intended to help readers gain a more comprehensive view on method panels or other optical devices.
Abstract Triboelectric nanogenerator (TENG), as an emerging technology for distributed energy harvesting, provides a promising solution self‐powered environmental monitoring. However, the abrasion of triboelectric materials lowers output performance TENGs, severely limiting their practical applications. Herein, novel travel‐controlled approach, by combining gear train and cam switch, is proposed to reduce mechanical wear. The automatic switching between contact non‐contact modes can be...
Capacitive pressure & proximity multi-function sensors are wildly used in applications such as 3D touch screen and electronic skin. However, those could not meet rigorous requirement for accurate quantitative monitoring due to the lower permittivity of dielectric material. Pb(ZrxTi1-x)O3 (PZT) material is featured remarkably high constant. Here this work, we present a flexible, transparent capacitive sensor with PZT single crystal nanowires (NWs) polydimethylsiloxane (PDMS) composite layer....
For measuring the surface profile of many micro-optical components with complicated shapes, which are made non-conductive material, electrostatic force microscopy (EFM) was recommended. The relationship between polarization and tip-to-sample distance analyzed based on dielectric theory. prototype scanning built. curves different samples materials shapes were detected by EFM prototype. Both theoretical analysis experimental results demonstrated that system can be used to measure non-conductor.
A scanning probe microscope with an electrostatic force has been introduced for the dimensional measurement of surface profile measurement. Since intensity is strongly depended on distance between a and sample surface, can be used in non contact condition. In order to detect tip method frequency modulation AFM employed. When bias voltage applied resonance oscillation shifted owing force. this paper, basic characteristics are investigated, experimentally. And then, absolute calculated by...
To enhance the robustness and lifespan of triboelectric nanogenerator (TENG) facilitate its industrial applications, herein, a self‐switching mode TENG that combines advantages contact noncontact is presented. Noncontact prevents material wear but generates insufficient power, whereas enhances power generation by increasing charge density on electrode surface. The proposed device can automatically switch between modes through triple‐cam mechanism gear train deceleration mechanism....
For measuring the surface profile of many micro-optical components which are made non-conductive material, such as diffractive grating and Fresnel lens, with complicated shapes on their surfaces, electrostatic force microscopy (EFM) was recommended in noncontact condition. When a bias voltage is applied between conducting probe tip back electrode where non-conducting sample put on, an will be generated surface. The change distance Firstly, relationship tip-sample analyzed based dielectric...
A long-stroke scanning electrostatic force probe (SEFP) is presented in this paper. The long range keeps large probe-to-sample distance when SEFP scans the profile. driven by an ultra-high precision Z scanner, which has a effective measurement of 50 μm with non-linearity error less than 10 nm as well least significant bit resolution 0.5 nm. profile prism sheet amplitude 25 measured SEFP. experiment result analyzed and effectiveness proposed for micro-structured surface demonstrated.
Abstract A home-made electrostatic force microscopy (EFM) system is described which directed toward assessment of the microscopic geometry surface specimens made non-conductive material with a large thickness. This based on variation in between conductive probe and specimen order to get its morphology. First, principle dielectric polarization, rules charged were studied. Later, special tuning fork resonant unit quartz crystal was fabricated for measurement force, scanning constant mode...