A5059907269- Electron and X-Ray Spectroscopy Techniques
- Advanced X-ray Imaging Techniques
- X-ray Spectroscopy and Fluorescence Analysis
- X-ray Diffraction in Crystallography
University of Washington
2019
We demonstrate that vacuum forming of 10-cm diameter silicon wafers various crystallographic orientations under an x-ray permeable, flexible window can easily generate spherically bent crystal analyzers and toroidally with ∼1-eV energy resolution a 1-m major radius curvature. In applications at synchrotron light sources, free electron lasers, laboratory spectrometers, these characteristics are generally sufficient for many absorption fine structure (XAFS), emission spectroscopy (XES),...
We demonstrate that vacuum forming of 10-cm diameter silicon wafers various crystallographic orientations under an x-ray permeable, flexible window can easily generate spherically bent crystal analyzers (SBCA) and toroidally (TBCA) with ~1-eV energy resolution a 1-m major radius curvature. In applications at synchrotron light sources, free electron lasers, laboratory spectrometers these characteristics are generally sufficient for many absorption fine structure (XAFS), emission spectroscopy...