A5018051710- Graphene research and applications
- Advanced Materials and Mechanics
- Advanced Sensor and Energy Harvesting Materials
- Semiconductor materials and interfaces
- Nanowire Synthesis and Applications
- Surface and Thin Film Phenomena
- Force Microscopy Techniques and Applications
- 2D Materials and Applications
- Quantum Dots Synthesis And Properties
- Nanomaterials and Printing Technologies
- Advancements in Semiconductor Devices and Circuit Design
- Carbon Nanotubes in Composites
Charles University
2017-2022
Czech Academy of Sciences, J. Heyrovský Institute of Physical Chemistry
2017-2022
Multilayered graphitic materials are not suitable as load-bearers due to their inherent weak interlayer bonding (for example, graphite is a solid lubricant in certain applications). This situation largely improved when two-dimensional (2-D) such monolayer (SLG) graphene employed. The downside these cases the presence of thermally or mechanically induced wrinkles which ubiquitous 2-D materials. Here we set out examine effect extensive large wavelength/ amplitude wrinkling on stress transfer...
Raman spectroscopy has become one of the most utilized methods for characterization transition metal dichalcogenides (TMDCs); however, interpretation spectra TMDC-based heterostructures been subject recent debate. Using a comprehensive combination micro-Raman and tip-enhanced spectroscopy, accompanied by ab initio simulations both frequencies intensities, we show that activation otherwise geometry-forbidden $E$ mode symmetry-forbidden ${A}_{1}$ is fingerprint strong interaction between...
Interfacing of materials with different dimensionalities becomes increasingly relevant for many applications which can utilize the exceptional properties low‐dimensional on one hand, and build‐up existing production know‐how bulk (3D) other. Numerous appealing possibilities are offered by such combinations. In this work, authors focus 2D–3D heterostructures composed mechanically exfoliated single‐ few‐layer layer graphene (Gr) coupled to freshly etched n‐doped silicon. Two ways...
The rise of nanomaterials requires a day-to-day implementation suitable nanoscale characterization techniques. Atomic force microscopy (AFM) has become such one, capable providing diverse information about the sample topography, mechanical and electrical properties with resolution down to few nanometers. work by Otakar Frank co-workers (article no. 1800305) shows two examples AFM application describe local photovoltaic graphene–silicon Schottky junctions. Direct measurement I–V curves at...