- Astrophysical Phenomena and Observations
- Adaptive optics and wavefront sensing
- Pulsars and Gravitational Waves Research
- Electron and X-Ray Spectroscopy Techniques
- Geophysics and Gravity Measurements
- Advanced Measurement and Metrology Techniques
- Astronomy and Astrophysical Research
- Stellar, planetary, and galactic studies
- Industrial Vision Systems and Defect Detection
- Advanced X-ray Imaging Techniques
- Advancements in Photolithography Techniques
- Surface Roughness and Optical Measurements
- Gamma-ray bursts and supernovae
- Digital Radiography and Breast Imaging
- Engineering Education and Technology
- Advanced Fiber Laser Technologies
- Radio Astronomy Observations and Technology
- Image Processing Techniques and Applications
- Digital Transformation in Industry
- Information Systems and Technology Applications
- Economic and Technological Systems Analysis
- Manufacturing Process and Optimization
- Solar and Space Plasma Dynamics
- Astronomical Observations and Instrumentation
Laboratoire d’études spatiales et d’instrumentation en astrophysique
2016-2023
Janssen (France)
2016-2023
Roche (France)
2022
Laboratoire Univers et Théories
2017
GRAVITY is a new instrument to coherently combine the light of European Southern Observatory Very Large Telescope Interferometer form telescope with an equivalent 130 m diameter angular resolution and collecting area 200 m$^2$. The comprises fiber fed integrated optics beam combination, high spectroscopy, built-in analysis control, near-infrared wavefront sensing, phase-tracking, dual operation laser metrology [...]. This article gives overview reports on performance first astronomical...
The goal of this paper is to investigate the detection by GRAVITY different relativistic effects affecting astrometric and/or spectroscopic observations S2 such as transverse Doppler shift, gravitational redshift, pericenter advance and higher-order general (GR) effects, in particular Lense-Thirring effect due angular momentum black hole. We showed that combination obtained with instrument spectrograph SINFONI (Spectrograph for INtegral Field Observations Near Infrared) also installed at VLT...
The second-generation beam combiner at the Very Large Telescope (VLT), GRAVITY, observes stars orbiting compact object located center of our galaxy, with an unprecedented astrometric accuracy 10 $\mu$as. nature this source is still unknown since black holes are not only candidates explaining four million solar masses Galactic center. Boson such alternative model to holes. This paper focuses on study trajectories a boson star and Kerr hole. We put in light strong differences between orbits...
Scanning or transmission electron microscopy (SEM/TEM) are standard techniques used during Research and Development (R&D) phases to study the structure morphology of microscopic materials. Variety in object shapes sizes observed such images ensure robust micro- nanomaterials critical dimension analysis. This way, precision accuracy can be guaranteed materials manufacturing processes. Such diversity complexity data make it challenging automatically extract desired measurements these...
In the next few years, near-infrared interferometer GRAVITY will be able to observe Galactic center. Astrometric data obtained with an anticipated accuracy of 10 $μ$as. To analyze these future data, we have developed a code called GYOTO compute orbits and images. We want assess validity in variety contexts, particular for stellar astrometry Furthermore, tackle complete study made on astrometric displacements that are due lensing effects star central parsec GYOTO. first validate...
Abstract The second generation instrument of the VLTI, GRAVITY, is expected to reach an astrometric accuracy about 10 μas. It will thus possible probe spacetime close compact source Sagittarius A* (Sgr A*) at Galactic Center by using accurate observations closest star Center, S2. In particular, we show that combining GRAVITY and spectrograph instruments allow us detect several relativistic effects such as pericenter advance or Lense-Thirring effect.
The research and development steps in the semiconductor industry require tools that are able to handle features with large variation across images, but also can reproduce definition of an edge taught by expert. This should be easily modified mimic expert decisions order reduce time spent process engineers during phases. We developed a patterned model allowing detect profile objects microscopic images. A complementary tool is proposed customize between two materials according targets....
Edge detection is the core of most metrology tools to identify boundaries between materials. With shrinking in size all devices for higher performances, this task becomes more and challenging. In addition, use new composition materials increases challenge by reducing contrast different The general quality images critical recover right edges, particular High Resolution Electronic Microscopy, which remains reference high during R&D phases. these images, low edges changes texture creating no...