Shelly Ren

ORCID: 0000-0002-0311-624X
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About
Contact & Profiles
Research Areas
  • Ion-surface interactions and analysis
  • Nuclear Physics and Applications
  • Distributed and Parallel Computing Systems
  • Machine Learning in Materials Science
  • Mineralogy and Gemology Studies
  • Nuclear reactor physics and engineering
  • Advanced Data Storage Technologies
  • Electron and X-Ray Spectroscopy Techniques
  • Scientific Computing and Data Management
  • Nuclear materials and radiation effects
  • X-ray Diffraction in Crystallography
  • nanoparticles nucleation surface interactions
  • Muon and positron interactions and applications
  • Advanced X-ray and CT Imaging
  • Particle physics theoretical and experimental studies
  • Superconducting Materials and Applications
  • ZnO doping and properties
  • Advanced Condensed Matter Physics
  • Nonlinear Optical Materials Studies
  • Computational Physics and Python Applications
  • Iron oxide chemistry and applications
  • Microstructure and Mechanical Properties of Steels
  • Physics of Superconductivity and Magnetism
  • X-ray Spectroscopy and Fluorescence Analysis

Oak Ridge National Laboratory
1997-2014

University of Tennessee at Knoxville
1994-1998

Materials Processing (United States)
1995

A Monte Carlo model was used to simulate specimen-electron beam interactions relevant electron back-scattered diffraction (EBSD). Electron trajectories were calculated for a variety of likely experimental conditions examine the interaction volume incident electrons as well that subset emerge from specimen, i.e., (BSEs). The spatial resolution EBSD investigated functions both materials properties, such atomic number, weight, and density, parameters, specimen thickness, tilt, accelerating...

10.1017/s1431927698980011 article EN Microscopy and Microanalysis 1998-02-01

10.1016/0168-583x(96)00123-1 article EN Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms 1996-08-01

In a busy world, continuing with the status-quo, to do things way we are already familiar, often seems be most efficient conduct our work. We look for value-add decide if investing in new method is worth effort. How shall evaluate have reached this tipping point change? For contemporary researchers, understanding properties of data good starting point. The generation neutron scattering instruments being built higher resolution and produce one or more orders magnitude larger than previous...

10.1088/1742-6596/251/1/012096 article EN Journal of Physics Conference Series 2010-11-01

The primary mission of user facilities operated by Basic Energy Sciences under the Department is to produce data for users in support open science and basic research [1]. We trace back almost 30 years history across selected illustrating evolution facility management practices how these have related performing scientific research. cover multiple techniques such as X-ray neutron scattering, imaging tomography sciences. Over time, detector acquisition technologies dramatically increased...

10.1088/1742-6596/180/1/012049 article EN Journal of Physics Conference Series 2009-07-01

Abstract The study of texture and grain boundary misorientation in multiphase materials has been greatly benefited from the recent automation electron back-scattered diffraction (EBSD) technique. With this technique, each phase a material can be individually sampled analyzed. This is great significance interest thin films, inclusions alloys. Spatial resolution, which depends on experimental conditions such as beam energy specimen tilt, being studied, critical order to determine orientation...

10.1017/s1431927600009764 article EN Microscopy and Microanalysis 1997-08-01

Abstract Whereas the spatial resolution for standard secondary electron (SEI) imaging in a scanning microscope or probe microanalyzer is related to incident diameter, x-ray microanalysis convolution of diameter with extent analyzed volume point probe. The latter determined by scattering specimen and subsequent emission excited x-rays from specimen. As such, it possible that “What you see not what get”. This especially true instruments high brightness sources (field emission). problem...

10.1017/s1431927600021498 article EN Microscopy and Microanalysis 1998-07-01
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