H. Chintakindi

ORCID: 0000-0002-0971-7804
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About
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Research Areas
  • X-ray Diffraction in Crystallography
  • Crystallization and Solubility Studies
  • Mass Spectrometry Techniques and Applications
  • X-ray Spectroscopy and Fluorescence Analysis
  • Optical measurement and interference techniques
  • Non-Destructive Testing Techniques
  • Enzyme Structure and Function
  • Electron and X-Ray Spectroscopy Techniques
  • Surface Roughness and Optical Measurements
  • Image Processing Techniques and Applications
  • Image and Signal Denoising Methods
  • Nuclear Physics and Applications

Czech Academy of Sciences, Institute of Physics
2023-2024

Czech Academy of Sciences
2023

Institute of Crystallography
2023

Italian Institute of Technology
2023

University of Bremen
2023

Estimating the error in merged reflection intensities requires a full understanding of all possible sources arising from measurements. Most diffraction-spot integration methods focus mainly on errors counting statistics for estimation uncertainties associated with intensities. This treatment may be incomplete and partly inadequate. In an attempt to fully understand identify contributions these errors, three are examined correction estimated electron diffraction data. For direct comparison,...

10.1107/s2053273323005053 article EN cc-by Acta Crystallographica Section A Foundations and Advances 2023-06-30

Conventional refinement strategies used for three-dimensional electron diffraction (3D ED) data disregard the bonding effects between atoms in a molecule by assuming pure spherical model called Independent Atom (IAM) and may lead to an inaccurate or biased structure. Here we show that it is possible perform going beyond IAM with data. We kappa which models charge transfers while model. demonstrate procedure analysing five inorganic samples; quartz, natrolite, borane, lutecium aluminium...

10.1038/s41467-024-53448-2 article EN cc-by-nc-nd Nature Communications 2024-10-21

<title>Abstract</title> Conventional refinement strategies used for three-dimensional electron diffraction (3D ED) data disregard the bonding effects between atoms in a molecule by assuming pure spherical model called Independent Atom (IAM) and may lead to inaccurate or biased structure. Here we show that it is possible perform going beyond IAM with data. We kappa which models charge transfers while model. demonstrate procedure analysing five inorganic samples; quartz, natrolite, borane,...

10.21203/rs.3.rs-4984819/v1 preprint EN Research Square (Research Square) 2024-09-05

With the advent of 3D Electron diffraction(3D ED) data acquisition and processing techniques, electron crystallography has garnered significant interest over last few years for accurate structure solutions refinements [1].In ED data, reflection intensities obtained from each frame must be corrected experimental effects such as absorption, changes in sample illumination, to some extent radiation damage.One methods achieve this is have all frames ideally on same scale [2].We analyzed problem...

10.1107/s2053273323085352 article EN Acta Crystallographica Section A Foundations and Advances 2023-08-22

10.1107/s2053273322091458 article EN Acta Crystallographica Section A Foundations and Advances 2022-08-23
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