A. Mukherjee

ORCID: 0000-0002-1511-6511
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About
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Research Areas
  • Crystallization and Solubility Studies
  • X-ray Diffraction in Crystallography
  • Crystallography and molecular interactions
  • Chalcogenide Semiconductor Thin Films
  • Quantum Dots Synthesis And Properties
  • Copper-based nanomaterials and applications
  • ZnO doping and properties
  • Gas Sensing Nanomaterials and Sensors
  • Transition Metal Oxide Nanomaterials
  • Catalysis and Oxidation Reactions
  • Supercapacitor Materials and Fabrication
  • Electronic and Structural Properties of Oxides
  • Graphene and Nanomaterials Applications
  • Ion-surface interactions and analysis
  • Concrete and Cement Materials Research
  • Advanced Materials and Semiconductor Technologies
  • High-Temperature Coating Behaviors
  • Chemical and Physical Properties of Materials
  • Fusion materials and technologies
  • Advancements in Battery Materials
  • Biodiesel Production and Applications
  • Catalytic Processes in Materials Science
  • Glass properties and applications
  • Magnetic Properties and Synthesis of Ferrites
  • Radioactive element chemistry and processing

Patliputra University
2019-2023

University of Burdwan
2014-2018

Tuskegee University
1989

City, University of London
1983-1987

Middlesex University
1974

Middlesex University
1973

Pure CdS and Cu-doped thin films were deposited using the spray pyrolysis technique characterized XRD, XPS, AFM, UV-VIS spectroscopy two probe DC-conductivity measurements. 2%, 4% 6% Cu-content was used for doping. The particle size found to decrease from 28 nm 25.4 upon Cu-doping. influence of Cu-doping on stress dislocation per unit volume has been estimated XRD data. AFM images annealed show changes in morphology with increase surface roughness 25 31 Cu-6% Reflectance transmission...

10.1016/j.jmrt.2018.10.017 article EN cc-by-nc-nd Journal of Materials Research and Technology 2019-03-15

Zinc sulphide (ZnS) thin film were prepared using chemical bath deposition (CBD) process and tin (Sn) doping was successfully carried out in ZnS. Structural, morphological microstructural characterization XRD, TEM, FESEM EDX. XRD SAED pattern confirms presence of hexagonal phase. Reitveld analysis MAUD software used for particle size estimation. A constantly decreasing trend observed with increasing incorporation ZnS which due to enhanced microstrain resulting incorporation. The wurtzite...

10.1590/1980-5373-mr-2016-0628 article EN cc-by Materials Research 2017-02-09

10.1007/s10854-023-10789-w article EN Journal of Materials Science Materials in Electronics 2023-06-01

Abstract SnS thin films were grown on glass substrates by a simple route named successive ion layer adsorption and reaction (SILAR) method. The prepared using tin chloride as (Sn) source ammonium sulfide sulphur (S) source. structural, optical morphological study was done XRD, FESEM, FT-IR UV-Vis spectrophotometer. XRD measurement confirmed the presence of orthorhombic phase. Particle size estimated from about 45 nm which fitted well with FESEM measurement. value band gap 1.63 eV indicating...

10.1515/msp-2015-0118 article EN Materials Science-Poland 2015-12-01

10.1016/0022-5088(83)90495-2 article EN Journal of the Less Common Metals 1983-08-01

A simple and cost effective chemical technique has been utilized to prepare cadmium sulphide (CdS) nanoparticles at room temperature. The sample is characterized with XRD (X-ray diffractometer), SEM (scanning electron microscope), TEM (transmission FTIR (Fourier transform infrared), EDX (energy dispersive X-rays), UV-VIS (ultraviolet visible) spectrophotometer. particle size estimated using X-ray line broadening method ~21.5 nm. While estimation, both instrumental strain was taken into...

10.1155/2014/138163 article EN cc-by Journal of Materials 2014-06-17

10.1016/j.jpcs.2015.03.009 article EN Journal of Physics and Chemistry of Solids 2015-03-09

Abstract In this research work, we have deposited cobalt oxide as pure and Ni-doped thin films using spray pyrolysis. The concentration of Ni has been changed from 0 to 6 wt% in all while other deposition parameters are fixed. characterization c X-ray diffraction (XRD), energy dispersive x-ray spectroscopy (EDX), photoelectron microscope (XPS), scanning electron (SEM), optical spectroscopy. XRD results confirm the formation Co 3 O 4 low-temperature stable phase successful doping with nickel....

10.1088/1402-4896/acc28b article EN Physica Scripta 2023-03-08

Abstract Cadmium oxide (CdO) thin films were grown on glass substrates by chemical bath deposition (CBD) method for different times using cadmium acetate as cationic precursor. The structural and optical characterization was carried out XRD, TEM, UV-Vis spectrophotometer measurements. Structural analyses with XRD confirmed cubic structure of the CdO. Average particle size estimated from Rietveld refinement pattern corresponded well TEM measurement. band gap varied between 2.35 eV to 2.48...

10.1515/msp-2017-0063 article EN Materials Science-Poland 2017-09-02

10.1016/s0022-0728(74)80178-6 article EN Journal of Electroanalytical Chemistry 1974-01-01

10.1016/0022-5088(85)90244-9 article EN Journal of the Less Common Metals 1985-05-01

Abstract Thin films of ZnO doped with 3 wt% Lanthanum were deposited on glass substrates using spray pyrolysis for varying thicknesses. The impact thickness the physical properties was investigated various techniques. XRD results revealed formation a mixture two phases, cubic Zinc Blende (ZB) and hexagonal Wurtzite (WU), their ratios changing based film thickness. Crystallite size measurements indicated that phase granules remained stable at 14.6 nm up to 719 nm, decreasing 14 846 while...

10.1088/1402-4896/ad5057 article EN cc-by-nc-nd Physica Scripta 2024-05-24
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