A5052104034- Electron and X-Ray Spectroscopy Techniques
- Advanced Electron Microscopy Techniques and Applications
- Advancements in Photolithography Techniques
- Surface and Thin Film Phenomena
- Graphene research and applications
- Machine Learning in Materials Science
- Semiconductor materials and devices
- X-ray Spectroscopy and Fluorescence Analysis
- Ion-surface interactions and analysis
- Nuclear Physics and Applications
- Corrosion Behavior and Inhibition
- Integrated Circuits and Semiconductor Failure Analysis
- Electronic and Structural Properties of Oxides
- Additive Manufacturing Materials and Processes
- Working Capital and Financial Performance
- Advanced Memory and Neural Computing
- Ga2O3 and related materials
- Taxation and Legal Issues
- Particle Detector Development and Performance
- Ferroelectric and Piezoelectric Materials
- Welding Techniques and Residual Stresses
- Molecular Junctions and Nanostructures
- Multiferroics and related materials
- 2D Materials and Applications
- Laser-induced spectroscopy and plasma
Czech Academy of Sciences, Institute of Scientific Instruments
2016-2025
Czech Academy of Sciences
2007
Abstract Carbon and carbon/metal systems with a multitude of functionalities are ubiquitous in new technologies but understanding on the nanoscale remains elusive due to their affinity for interaction environment limitations available characterization techniques. This paper introduces spectroscopic technique demonstrates its capacity reveal chemical variations carbon. The effectiveness this approach is validated experimentally through spatially averaging techniques using Monte Carlo...
Summary Collection of the secondary electrons in scanning electron microscope was simulated and results have been experimentally verified for two types objective lens three detection systems. The aberration coefficients both lenses as well maximum axial magnetic fields specimen region are presented. Compared a standard side‐attached detector, which only weak electrostatic nearly no field influence signal trajectories vicinity, (lower) upper detectors an immersion system with but strong...
Abstract This paper presents computed dependencies of the detected electron energy distribution on water vapour pressure in an environmental scanning microscope obtained using EOD software with a Monte Carlo plug-in for electron-gas interactions. The GEANT was used simulations beam-sample interactions and signal emission from sample into gaseous environment. were carried out selected energies electrons collected by two electrodes different diameters voltages +350 V 0, respectively, then 0 V,...
Two-dimensional materials, such as graphene, are usually prepared by chemical vapor deposition (CVD) on selected substrates, and their transfer is completed with a supporting layer, mostly polymethyl methacrylate (PMMA). Indeed, the PMMA has to be removed precisely obtain predicted superior properties of graphene after process. We demonstrate new effective technique achieve polymer-free CVD — utilizing low-energy electron irradiation in scanning microscope (SLEEM). The influence...
The success of machine learning (ML) models in object or pattern recognition naturally leads to ML being employed the classification microstructure steel surfaces. Light optical microscopy (LOM) is traditional imaging process this field. However, increasing use extract relate more aspects aforementioned materials and limitations LOM motivated us provide an improvement established image acquisition process. In essence, we perform style transfer from scanning electron (SEM) combined with...
Three-dimensional simulations of the trajectories secondary electrons (SE) in scanning electron microscope have been performed for plenty real configurations specimen chamber, including all its basic components. The primary purpose was to evaluate collection efficiency Everhart-Thornley detector SE and reveal fundamental rules tailoring set-ups which efficient signal acquisition can be expected. Intuitive realizations about easiness attracting SEs towards biased front grid shown themselves...
New type of detection system has been designed and tested in the Scanning Electron Microscope. Backscattered electrons (BSE) at low energies electron impact are collected by an annular detector above specimen, consisting eight concentric ring-shaped collectors arranged around optical axis so that polar angles initial velocity vectors can be distinguished. Backscattering electrons, particular below 1 keV energy, provides rich information content even enhances toward higher with respect to...
Scanning electron microscopes come equipped with different types of detectors for the collection signal electrons emitted from samples. In-lens detection systems mostly consist several auxiliary electrodes that help to travel in a direction towards detector. This paper aims show through-the-lens detector commercial microscope Magellan 400 FEG can, under specific conditions, work as an energy band-pass filter secondary are excited by primary beam electrons. The properties verify extensive...
The detailed examination of electron scattering in solids is crucial importance for the theory solid-state physics, as well development and diagnostics novel materials, particularly those micro- nanoelectronics. Among others, an important parameter inelastic mean free path (IMFP) electrons both bulk materials thin films, including 2D crystals. amount IMFP data available still not sufficient, especially very slow This situation motivated present study, which summarizes pilot experiments...
We discuss an extension to the transmission mode of cathode-lens-equipped scanning electron microscope, enabling operation down lowest energies electrons. Penetration electrons through free-standing ultrathin films is examined along full energy scale, and contribution secondary (SEs), released near bottom surface sample, shown, enhancing apparent transmissivity sample more than 100%. Provisional filtering off SEs, providing dark-field signal forward-scattered electrons, was made using...
ABSTRACT In this work, we present calculations of energy loss spectra corresponding to slow electrons (100 − 1000 eV) interacting with a graphene monolayer. We use dielectric two‐dimensional model for the conductivity developed more energetic (>50 keV) and explore its applicability in range energies. The studied configuration is comparable spectroscopy experiments implemented scanning low‐energy electron microscope equipped time‐of‐flight device. analyze both theoretical experimental...
Journal Article Practical Use of Scanning Low Energy Electron Microscope (SLEEM) Get access Ilona Müllerová, Müllerová Department Microscopy, Institute Scientific Instruments ASCR, v.v.i., Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Eliška Mikmeková, Mikmeková Šárka Ivo Konvalina, Konvalina Luděk Frank Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 1650–1651, https://doi.org/10.1017/S1431927616009090 Published: 25 2016
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – 8, 2013.
Precise control of ferroelectric and multiferroic domain states at the nanoscale is considerable interest due to potential boost development next-generation low-energy-consumption nanoelectronic components. Progress in this field closely related advances spatially resolved characterization methods. In regard, scanning electron microscopy (SEM) as a powerful highly versatile imaging technique with diversified inner detectors possesses huge for scale-bridging studies (spanning from micrometers...
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