Leonardo De Chiffre

ORCID: 0000-0002-6141-9580
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About
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Research Areas
  • Advanced Measurement and Metrology Techniques
  • Advanced machining processes and optimization
  • Advanced Surface Polishing Techniques
  • Surface Roughness and Optical Measurements
  • Advanced X-ray and CT Imaging
  • Manufacturing Process and Optimization
  • Adhesion, Friction, and Surface Interactions
  • Scientific Measurement and Uncertainty Evaluation
  • Medical Imaging Techniques and Applications
  • Radiation Dose and Imaging
  • Optical measurement and interference techniques
  • Advanced Machining and Optimization Techniques
  • Advanced Sensor Technologies Research
  • Tribology and Lubrication Engineering
  • Electron and X-Ray Spectroscopy Techniques
  • Additive Manufacturing and 3D Printing Technologies
  • Industrial Vision Systems and Defect Detection
  • Engineering Technology and Methodologies
  • Metallurgy and Material Forming
  • Sensor Technology and Measurement Systems
  • Metal Forming Simulation Techniques
  • Injection Molding Process and Properties
  • Force Microscopy Techniques and Applications
  • Advancements in Photolithography Techniques
  • Integrated Circuits and Semiconductor Failure Analysis

Technical University of Denmark
2014-2024

Swiss Federal Institute of Metrology
2015

Instituttet for Produktudvikling (Denmark)
2007

University of Padua
1996-2002

University of Brescia
2001

10.1016/j.jmatprotec.2005.05.029 article EN Journal of Materials Processing Technology 2005-08-01

10.1016/s0924-0136(03)00679-4 article EN Journal of Materials Processing Technology 2004-04-28

This work addresses dimensional measurements performed with the scanning electron microscope (SEM) using 3D reconstruction of surface topography through stereo-photogrammetry. The paper presents both theoretical and experimental investigations, on effects instrumental variables measurement parameters accuracy. Investigations were a novel sample, specifically developed implemented for tests. description is based model function introduced by Piazzesi adapted eucentrically tilted stereopairs....

10.1088/0957-0233/19/6/065705 article EN Measurement Science and Technology 2008-05-19

10.1016/j.cirpj.2012.03.005 article EN CIRP journal of manufacturing science and technology 2012-01-01

Computed tomography has entered the industrial world in 1980’s as a technique for non-destructive testing and nowadays become revolutionary tool dimensional metrology, suitable actual/nominal comparison verification of geometrical tolerances. This paper evaluates measurement results using different measuring strategies applied inspection software packages volume surface data analysis. The strategy influence is determined by calculating uncertainty. investigation includes measurements two...

10.1051/ijmqe/2012011 article EN International Journal of Metrology and Quality Engineering 2012-01-01

The possibility of measuring multi-material components, while assessing inner and outer features simultaneously makes X-ray computed tomography (CT) the latest evolution in field coordinate measurement systems (CMSs). However, difficulty selecting suitable scanning parameters surface determination settings, limits a better acceptance CT as CMS. Moreover, standard users are subject to algorithms boundary conditions implied by use commercial analysis software. In this context, paper is...

10.1016/j.csndt.2016.04.003 article EN cc-by-nc-nd Case Studies in Nondestructive Testing and Evaluation 2016-05-07

10.1016/0020-7357(77)90016-6 article EN International Journal of Machine Tool Design and Research 1977-01-01

10.1016/0020-7357(76)90032-9 article EN International Journal of Machine Tool Design and Research 1976-01-01
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