Over the years, serial scan design has become de-facto for testability technique. The ease of testing and high test coverage made it gain widespread industrial acceptance. However, there are penalties associated with design. These include performance degradation, data volume, application time, power dissipation. overhead is due to multiplexers added inputs every flip-flop. In today's very high-speed designs minimum possible combinational depth, degradation caused by multiplexer magnified....

Scan-based side-channel attacks have been gaining a prominence among the malicious attackers. The unprotected scan chains are extremely vulnerable and could be exploited to extract secret information from security chip such as an Advanced Encryption Standard (AES) cryptochip. To protect being hacked it is utmost necessary redesign chain with features. In this paper, we propose secure architecture aiming at protection of AES cryptochips against scan-based attacks. proposed idea based on...

The strategies for breaking a cipher has been shifting towards side channel attacks which exploit the run-time physical attributes of cryptographic chips. Among many such attacks, scan-based attack become convenient approach attackers to extract secret information. As reported in academic research, side-channel have successfully mounted on Advanced Encryption Standard (AES) crypto On other hand, scan design-for-test (DfT) mandatory practice almost all modern designs test, debug, and...

Modern VLSI circuits feature various embedded instruments that support non-functional features, e.g., test/debug, diagnosis, post silicon validation, in-field maintenance, etc. The IEEE Std. 1687 (IJTAG) facilitates efficient access to these on-chip using a special scan cell known as Segment Insertion Bit (SIB). Concomitantly, it provides covert channel for potential intruders gain unauthorized and thus extract confidential data such FPGA firmware, secret keys, Thus, is quite imperative...

Almost every complex circuit today employs scan-based Design-for-Testability (DFT) architecture to enhance controllability and observability for flip-flop in the design, thereby improve testability. However, DFT structure can also be exploited mount side-channel attacks retrieve secret key stored a cryptographic chip, thus compromising its security. In this paper, we propose new secure scan test which isolates encryption whenever chip is switched mode. The remains isolated during whole...

Test and diagnosis requirements has made the use of scan design unavoidable for present day highly complex circuits. However, can be exploited to retrieve secret information stored on a crypto chip by mounting based side channel attack. The poses threat security chips as it gives user capability control/observe circuit state. In this paper, we propose technique secure that effectively defend against side-channel attacks. To architecture first needs supply test authorization key. Once is...

Scan based diagnosis plays a critical role in yield enhancement of sub-nanometer technology chips. However, the scan chain itself can be subject to defects due large logic circuitry associated with it which constitute significant fraction total chip area. In some cases, has been observed that failures may account for 30% 50% failures. Hence, testing and become very crucial recent years. this paper, we propose hardware-assisted low cost complexity technique. The proposed technique is simple...

The demand for high performance system-on-chips (SoC) in communication and computing has been growing continuously. To meet the goals, very aggressive circuit design techniques such as use of smallest possible logic depth are being practiced. Replacement normal flip-flops with scan adds an additional multiplexer delay to critical path. Furthermore combinational decreases, degradation caused by become more critical. Elimination off functional path crucial maintaining performance. In this work...

Power dissipation during scan testing of modern high complexity designs could be many folds higher than the functional operation power, which is a well established observation. High test power can severely affect chip yield and hence final cost product. This makes it utmost important to develop low methodologies. In this work we have proposed modified flip-flop design uses dynamic slave latch shift vectors allows static retain responses from previous vector. Through bypassing...

The IEEE 1687 standard, which is commonly used for efficient access of on-chip instruments, could be exploited by an intruder and thus needs to secured. One the techniques alleviate vulnerability network use a secure protocol that based on licensed software, Chip ID locking SIB. A software generally gain control embedded instruments them as per requirement.

Scan design-for-test (DfT) feature can be exploited as a side channel to break cryptographic chip. The stringent test and diagnosis requirements of present-day complex system-on-chip (SoC) make use the scan DfT unavoidable. However, being threat chips, it needs secured against scan-based side-channel attacks. In this paper, we propose simple yet effective technique prevent attack on Advanced Encryption Standard (AES) proposed restricts user from applying any random inputs at plain-text...

The IEEE Std 1687 (IJT AG) provides enhanced access to the on-chip test instruments, which are included on chip for test, post-silicon debug, in field maintenance, and diagnosis purposes. Although instruments data features explicitly these misused by malicious user sensitive such as encryption keys, Chip-IDs, etc. Hence, it is desired limit via IJT AG network. One of various schemes proposed mitigate vulnerability network use a secure protocol, based LSIB, Chip-ID, licensed software.In this...

The scan based Design-for-Test (DFT) architecture is a well-known side-channel that can be misused by malicious user to retrieve the secret encryption key stored on cryptographic chip. In this paper, we propose secure test technique prevent all known attacks. proposed masks cipher at very first instance circuit switched from functional mode mode. remains isolated during whole process. addition that, also clears last state of security sensitive cells and does not allow attacker have peep into...

Over the years, serial scan design has became defacto Design for Testability (DFT) technique. The ease of testing and high test coverage made it to gain wide spread industrial acceptance. However, there are associated penalties with scan. These include performance degradation, data volume, application time, power dissipation. overhead is due multiplexers added inputs every flip-flop. In today's very speed designs minimum possible combinational depth, degradation caused by multiplexer...

The rise of Machine Learning as a Service (MLaaS) has led to the widespread deployment machine learning models trained on diverse datasets. These are employed for predictive services through APIs, raising concerns about security and confidentiality due emerging vulnerabilities in prediction APIs. Of particular concern model cloning attacks, where individuals with limited data no knowledge training dataset manage replicate victim model's functionality black-box query access. This commonly...

Scan design is the most commonly used technique to ensure high test coverage in contemporary chips. However, attackers may use it as a trapdoor gain access chip internals. Thus, affects overall security. Several techniques have been proposed protect sensitive data from hackers. Recently, countermeasure has that obfuscates scan using key. This scheme looks simple and effective against all existing scan-based attacks. detailed analysis of reveals vulnerable side-channel In this paper, shown...