A5040337908- X-ray Diffraction in Crystallography
- Crystallization and Solubility Studies
- Magnetic properties of thin films
- ZnO doping and properties
- Copper Interconnects and Reliability
- Terahertz technology and applications
- Silicon Carbide Semiconductor Technologies
- Surface and Thin Film Phenomena
- Magnetic Properties and Synthesis of Ferrites
- Advanced Memory and Neural Computing
- Crystallography and molecular interactions
- Laser Design and Applications
- Electrostatic Discharge in Electronics
- Spectroscopy and Laser Applications
- Quantum and electron transport phenomena
- Photonic and Optical Devices
- Gyrotron and Vacuum Electronics Research
- Pulsed Power Technology Applications
- Lightning and Electromagnetic Phenomena
- Physics of Superconductivity and Magnetism
Xi'an University of Technology
2023
Jilin Normal University
2013-2016
Nanjing University
2005-2006
Abstract A general avalanche tester that utilizes an unclamped inductive switching (UIS) test is essential for measuring the maximum energy a power device can withstand before failure. This procedure critical evaluating reliability and robustness of devices. Avalanche testers typically require high-precision hollow inductors with broad adjustable ranges fine increments to accommodate varying conditions different However, this often results in large, heavy, expensive inductor modules. In...
A novel pulse compression diode capable of generating high-voltage, picosecond pulses is introduced. The design concept and technical means the based on semi-insulating gallium arsenide (SI-GaAs) materials are described, followed by presentation its static characteristics with three unique operating states. Typical output rise time for self-breakdown limited to a few nanoseconds (1–2 ns). basic physical mechanism affecting fast conduction device then analyzed, electrode structure optimized...