Arman Ter-Petrosyan

ORCID: 0000-0003-0923-8253
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About
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Research Areas
  • Electron and X-Ray Spectroscopy Techniques
  • Machine Learning in Materials Science
  • Industrial Vision Systems and Defect Detection
  • Surface Chemistry and Catalysis
  • Electronic and Structural Properties of Oxides
  • Graph Theory and Algorithms
  • X-ray Diffraction in Crystallography
  • Model-Driven Software Engineering Techniques
  • Advanced X-ray and CT Imaging
  • Medical Imaging Techniques and Applications
  • Advanced X-ray Imaging Techniques
  • Advanced Electron Microscopy Techniques and Applications
  • Metallurgy and Material Forming
  • Semiconductor materials and devices

Pacific Northwest National Laboratory
2023-2025

University of California, Berkeley
2023

Thin film deposition is a fundamental technology for the discovery, optimization, and manufacturing of functional materials. Deposition by molecular beam epitaxy (MBE) typically employs reflection high-energy electron diffraction (RHEED) as real-time in situ probe growing film. However, state-of-the-art RHEED analysis during requires human observation. Here, we present an approach using machine learning (ML) methods to monitor, analyze, interpret images on-the-fly thin deposition. In...

10.1116/6.0004493 article EN cc-by-nc Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 2025-03-27

10.11578/dc.20240603.1 article OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) 2024-06-03

The development of high-performance materials for microelectronics, energy storage, and extreme environments depends on our ability to describe direct property-defining microstructural order. Our present understanding is typically derived from laborious manual analysis imaging spectroscopy data, which difficult scale, challenging reproduce, lacks the reveal latent associations needed mechanistic models. Here, we demonstrate a multi-modal machine learning (ML) approach order electron...

10.48550/arxiv.2411.09896 preprint EN arXiv (Cornell University) 2024-11-14

Journal Article Maximizing Modalities: Accelerating Quantitative Multimodal Electron Microscopy Get access Sarah Akers, Akers National Security Directorate, Pacific Northwest Laboratory, Richland, WA, United States Search for other works by this author on: Oxford Academic Google Scholar Jenna Pope, Pope Arman Ter-Petrosyan, Ter-Petrosyan StatesDepartment of Physics, University California-Berkeley, Berkeley, CA, Bethany Matthews, Matthews Energy and Environment Rajendra Paudel, Paudel...

10.1093/micmic/ozad067.964 article EN Microscopy and Microanalysis 2023-07-22

We present a method for the unsupervised segmentation of electron microscopy images, which are powerful descriptors materials and chemical systems. Images oversegmented into overlapping chips, similarity graphs generated from embeddings extracted domain$\unicode{x2010}$pretrained convolutional neural network (CNN). The Louvain community detection is then applied to perform segmentation. graph representation provides an intuitive way presenting relationship between chips communities....

10.48550/arxiv.2311.08585 preprint EN cc-by arXiv (Cornell University) 2023-01-01
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