Stefan Kose

ORCID: 0000-0003-2051-1097
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About
Contact & Profiles
Research Areas
  • Terahertz technology and applications
  • Optical measurement and interference techniques
  • Image Processing Techniques and Applications
  • Advanced X-ray Imaging Techniques
  • Microwave and Dielectric Measurement Techniques
  • Superconducting and THz Device Technology
  • Microwave Imaging and Scattering Analysis
  • Calibration and Measurement Techniques
  • Geophysical Methods and Applications
  • Thermography and Photoacoustic Techniques
  • Indoor and Outdoor Localization Technologies
  • Advanced Semiconductor Detectors and Materials
  • Advanced Electrical Measurement Techniques
  • Semiconductor Quantum Structures and Devices

Fraunhofer Institute for High Frequency Physics and Radar Techniques
2011-2021

Providing a deeper look beneath the surface is key function of product security and materials scanners [1]. Until recently, only ultrasonic X-ray systems made this possible [2]. Now, electromagnetic waves, which allow view through nonconducting materials, offer competitive alternative [3]. While examinations using methods are common, because required safety regulations, option relatively costly. Current optical sensor systems, on other hand, inexpensive, but they limited information about...

10.1109/mmm.2017.2712018 article EN IEEE Microwave Magazine 2017-08-07

A portable multisensor frequency modulated continuous radar (FMCW) networked concept is presented for the localization of persons trapped in debris building collapse scenarios. 2-D algorithm evaluated a field test to demonstrate successful detection respiration micromovements.

10.1109/lmwc.2021.3132788 article EN IEEE Microwave and Wireless Components Letters 2021-12-15

The following paper describes the development of an autonomous and compact millimeter wave scanning measurement system (SAMMI - Stand Alone Millimeter Imager) which works in W-Band (CW@78GHz). SAMMI <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">®</sup> was developed to demonstrate high potential usability region for material classification[1].

10.1109/irmmw-thz.2011.6105003 article EN International Conference on Infrared, Millimeter, and Terahertz Waves 2011-10-01

Millimetre wave sensors are capable of measuring the structure and composition as well detecting small variations thereof in a wide range dielectric materials, such plastics, dry goods foodstuffs. To produce an image that modern recognition algorithms can be applied on, resolution, i.e. pixel density, comparable to those optical cameras has realized. In this paper, we present rotating scanner system operates CW mode at 90 GHz allows for high density medium measurement object velocities using...

10.23919/eurad.2018.8546573 article EN 2021 18th European Radar Conference (EuRAD) 2018-09-01

Millimeter wave imaging technologies offer a wide spectrum of new applications. Research results the last year's show, that millimeter waves can be used to detect letter bombs and non-metallic impurities inside products or control material parameters in real-time applications fluctuations during production. The main challenge for an operational system is development fast cheap scanner concepts this frequency range

10.1109/eumc.2015.7345795 article EN 2015-09-01
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