- VLSI and Analog Circuit Testing
- Integrated Circuits and Semiconductor Failure Analysis
- Analog and Mixed-Signal Circuit Design
- Advancements in Semiconductor Devices and Circuit Design
- Radiation Effects in Electronics
- Electrostatic Discharge in Electronics
- Advancements in PLL and VCO Technologies
- Engineering and Information Technology
- Semiconductor materials and devices
- Low-power high-performance VLSI design
- Hand Gesture Recognition Systems
- Bluetooth and Wireless Communication Technologies
- Tactile and Sensory Interactions
- Power Line Communications and Noise
- Embedded Systems Design Techniques
- Engineering and Test Systems
- Context-Aware Activity Recognition Systems
- Gaze Tracking and Assistive Technology
- 3D IC and TSV technologies
- Banking Sector Performance and Management
- Opportunistic and Delay-Tolerant Networks
- Electromagnetic Compatibility and Noise Suppression
- Sensor Technology and Measurement Systems
- Innovative Energy Harvesting Technologies
- Organizational Management and Innovation
Universidad Católica de Córdoba
2013-2024
Integra (United States)
2023
Microelectronica (Romania)
2008
This paper presents the design and implementation of a system accelerometer-based hand gesture recognition. will be embedded within modern remote control to improve human-machine interaction in context digital TV Argentina. As recognition gestures is pattern classification problem, two techniques based on artificial neural networks are explored: multilayer perceptron support vector machine. performed order compare results select tool that best fits problem. Jointly, signal processing used...
Oscillation-based testing (OBT) has been proven to be a simple, yet effective VLSI test for numerous circuit types. This paper investigates, the first time, application of OBT verification second generation current conveyors (CCIIs). The is formed by connecting CCII into simple Wien bridge oscillator and monitoring both amplitude frequency oscillation. fault detection rate, taking account open short simulation analyses, indicates 96.34% coverage using combination output sensing in all...
A new CMOS voltage reference, which takes advantage of the temperature dependence NMOS and PMOS threshold voltages, is presented. Due to circuit architecture mobility factor completely cancelled. It does not use resistors all transistors works in strong inversion. The simple, opamp-less can be implemented a standard process. When input power supply changes from 1.8V 2.1V -20 80degC, simulations for reference using proposed shows an output 1.184V T <sub...
In this work, we explore the ability of OBT for testing OTA-C filters with a more complex OTA configuration than in previously reported one. Adopting second-order structure as case study, use non-linear block feedback loop order to force oscillations. The evaluation test quality is made by fault simulation. simulation results show that filter present very good coverage values.
This paper presents an Oscillation Based Test (OBT) scheme applied to a Gm-C band pass filter lacking on-chip automatic tuning system. The fact of dealing with untuned filters prevents careless application the traditional OBT. is because, as consequence process parameters dispersion, use one unique and fixed reference oscillation frequency for evaluating test results no longer practical. In order overcome this problem new approach based on relative comparison two frequencies proposed....
Oscillation based testing (OBT) has proven to be a simple yet effective VLSI test for numerous circuit types. In this work, OBT is applied Second-generation Current Conveyor (CCII) filters the first time. Adopting CCII-based band pass filter as case study, it shown that can implemented with minimally intrusive switched feedback loop establish oscillator. Exhaustive fault simulation indicates 98.11% detection of possible short and 100% open faults in under test, both 0.35μm 1.2μm CMOS...
In this work, we explore the ability of oscillation-based test (OBT) for testing OTA-C filters. Adopting a second-order band pass filter as case study, present scheme that uses non linear characteristic in feedback loop. The effectiveness strategy is qualified by means fault simulation.
The threshold voltage (V <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">th</inf> ) is a key parameter in MOSFET design and modeling. There are many definitions extraction methods, each one given with focus on different aspects. This work presents simple circuit that extracts the under low conditions using feedback loop order to reach supply independence. has been simulated BSIM3v3 model for 0.18µm CMOS process. extracted value of VTHN very...
The present work studies the response to an Analog Single Event Transient (ASET) of a Silicon-on-insulator (SOI) OTA. By adopting ASET model previously reported and fully compatible with SPICE descriptions, simulation campaign is carried out in SOI OTA taken as case study. technology happens be well suited for radiation-hardened applications rapidly becoming main-stream commercial technology. However, one main reasons rapid degradation ICs space natural radiation environment there. faults...
A novel scheme for a CMOS low-voltage reference is proposed. It uses current subtraction between the currents generated by two instances of same generator circuit, each one configured with different magnitude and temperature coefficients. Temperature stability achieved owing to partial compensation MOSFET threshold voltage mobility effects. For nominal 436.5 mV, SPICE simulation reveals ±38.2 ppm/°C coefficient within range -20 °C 100°C.
This paper presents an enhanced Oscillation Based Test (OBT) scheme that performs a relative comparison between two oscillation frequencies, eliminating the need of fixed reference and allowing in this way application OBT technique to non tuned circuits. Indeed, fact dealing with untuned filters prevents careless traditional OBT. is because, as consequence process parameters dispersion, use one unique frequency for evaluating test results no longer practical. In order overcome problem new...
Oscillation based testing (OBT) relies on converting the Circuit Under Test (CUT) into an oscillator during test phase by adding a feedback loop in order to provoke self-sustained oscillation which is monitored at output. The output frequency and amplitude has previously been shown found sensitive variation OBT's passive circuit, while choice of topology was influence discrimination between faulty non-faulty circuits idealized circuits. In this work, we evaluate fault three different OBT...
At the present, digital TV allows access to a greater amount of content and execute interactive applications. The remote control used systems is, in most cases, still solved by traditional infrared control, which has become limiting factor on user interaction with TV. This paper introduces design development an device for use context Argentina. proposed can be considered evolution classic functionality hand gesture recognition is implemented as natural friendly interface controlling home. A...
Radiation-resistant temperature sensors are vital for ensuring reliability in radiation-intensive environments, where the highly energetic and penetrating nature of radiation can significantly impact electronic devices sensors. In such like those near intense sources or challenging radiation-rich settings, as space, gamma lead to erroneous measurements equipment failures. play a crucial role maintaining measurement accuracy they designed minimize interference caused by radiation, protecting...
This paper presents a proof of concept performed on new and very simple CMOS circuit configuration that implements radiation dosimeter based the threshold voltage difference (VTH) principle. The used does not use resistors all transistors work in strong inversion, their mobility factor being completely canceled by proposed architecture. Its operation exploits relationship between VTH shifting, which allows, through configuration, to compensate for temperature variation amplify reaction...
This paper presents a DC analog testing technique based on simple voltage comparison of the highest sensitivity-to-faults node, which is found by simulation. The structural, fault driven approach and can be applied to any circuit with very few extra added circuitry. A proof concept has been implemented in 65nm low-voltage transconductor, showing good coverage for both catastrophic parametric faults.
This paper studies the effect of Analog Single-Event Transients (ASETs) in OTA-C struc tures. By adopting an ASET model previously reported and fully compatible with SPICE de scriptions, a simulation campaign is carried out low-pass filter taken as case study. The results this show that structure circuit under study presents high sensibility to ASETs. Consequently, use should be avoided systems op erate environments heavy ions, unless techniques such fault tolerance or radiation hardening...
In this work, the design of a new architecture Continuous Time (CT) MASH 2-2 (multi-stage noise shaping modulators) full feedforward Sigma Delta (ΣΔ) modulator is presented. This carried out by using Discrete-Time (DT) first and Impulse-Invariant transformation techniques later. proposal, structures, that allows implementation stable high-order modulators, are combined with architectures which reduce signal ranges required at integrators inputs outputs. combination leads to swing slewing...
Oscillation based testing (OBT) of operational transimpedance amplifiers (OTAs) has previously been shown sensitive to variation in oscillator component values, with significant influence on the OBT circuit's ability discriminate between faulty and non-faulty circuits. Here, we extend prior analyses by comparing fault discrimination eight different topologies for OTAs designed 0.5 μm CMOS. It is found that appropriate choice circuit can increase sensitivity an injected up 4.86 times f <sub...
A new low-voltage electrically tunable transconductor is presented. Its transconductance can be settled by means of a ratio between reference current and voltage rendering the circuit independent technological parameters, to first order approach. This property allows, some extent, reusing in several CMOS processes. kind linear division strategy turns also inversely proportional product two ratios transistors' sizes that chosen so as meet desired Gm magnitude. feature, together with...
Oscillation based testing (OBT) has proven to be a simple and effective test strategy for numerous kind of circuits. In this work, OBT is applied radiation sensor used as VLSI cell in embedded applications, implementing an oscillation built-in self-test (OBIST) structure. The condition achieved by means minimally intrusive switched feedback loop the response evaluation circuit can included very way, minimizing hardware overhead. fault simulation indicates coverage 100% under test.Keywords:...
The design and test of a mixed-signal 9.6Kb/s FSK transmitter-receiver is presented. It aimed for digital communications through the domiciliary power lines as needed by networked electrical management measuring system wherein circuit must be embedded. For desired baud rate bit carriers frequencies 111KHz (logical 0) 125KHz 1) were found optimal. receiver amplifies demodulates incoming stream following frequency-domain discrimination strategy based on switched capacitor (SC) filtering....