T. Kim

ORCID: 0000-0003-3050-5280
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About
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Research Areas
  • Blind Source Separation Techniques
  • Nanomaterials and Printing Technologies
  • Vascular Tumors and Angiosarcomas
  • Tactile and Sensory Interactions
  • Asthma and respiratory diseases
  • Eosinophilic Disorders and Syndromes
  • Computer Graphics and Visualization Techniques
  • Advanced Data Compression Techniques
  • Mesenchymal stem cell research
  • Image and Signal Denoising Methods
  • Ferroelectric and Negative Capacitance Devices
  • Infectious Diseases and Mycology
  • Allergic Rhinitis and Sensitization
  • Advanced Vision and Imaging
  • Advanced Sensor and Energy Harvesting Materials
  • Advanced Memory and Neural Computing
  • Medical Image Segmentation Techniques
  • Neuroscience and Neural Engineering
  • Dermatology and Skin Diseases
  • Contact Dermatitis and Allergies

Inha University
2024

Yonsei University
2023

Seoul National University
2003-2018

New Generation University College
2010-2012

Since volume rendering needs a lot of computation time and memory space, many researches have been suggested for accelerating or reducing data size using compression techniques. However, there is little progress in research accomplishing these goals. This paper presents an efficient wavelet-based method providing fast visualization large data, which divided into individual blocks with regular resolution. Wavelet transformed block runlength encoded accordance the reconstruction order...

10.1109/pccga.1999.803358 article EN 2003-01-20

The authors present a spike-triggered adaptive neuron circuit with input current modulation. Unlike circuits where adaptation is realised by leakage modulation, the presented in this Letter modulates to membrane capacitor. Therefore, it possible reduce extra power consumption originating from increased leakage. Threshold voltage modulation of silicon on insulator (SOI) MOSFET back gate effect used change amount injected for same voltage. Through method, work consumed 25.9% less than one modulating

10.1049/el.2018.5047 article EN Electronics Letters 2018-07-07
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