A5022006767- Electron and X-Ray Spectroscopy Techniques
- Advanced Electron Microscopy Techniques and Applications
- Advanced X-ray Imaging Techniques
- Advanced Materials Characterization Techniques
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Nuclear Physics and Applications
- Ion-surface interactions and analysis
- Radiation Detection and Scintillator Technologies
- Photoreceptor and optogenetics research
- Library Science and Administration
- Technology Adoption and User Behaviour
- Gender, Education, and Development Issues
- Particle Accelerators and Free-Electron Lasers
- X-ray Spectroscopy and Fluorescence Analysis
- ICT in Developing Communities
- Politics and Conflicts in Afghanistan, Pakistan, and Middle East
- Atomic and Subatomic Physics Research
- Photosynthetic Processes and Mechanisms
- Anodic Oxide Films and Nanostructures
- Organizational and Employee Performance
- E-Government and Public Services
- Digital Marketing and Social Media
- Graphene research and applications
- Crystallography and Radiation Phenomena
Nanjing University
2023-2024
Corrected Electron Optical Systems (Germany)
2004-2019
Forschungszentrum Jülich
1998
The ability of electron microscopes to analyze all the atoms in individual nanostructures is limited by lens aberrations. However, recent advances aberration-correcting optics have led greatly enhanced instrument performance and new techniques microscopy. development an ultrastable microscope with a monochromated high-brightness source has significantly improved resolution contrast. In present work, we report information transfer beyond 50 pm show images single gold signal-to-noise ratio as...
Contrast-transfer calculations indicate that C(c) correction should be highly beneficial for high-resolution and energy-filtered transmission electron microscopy. A prototype of an optical system capable correcting spherical chromatic aberration has been used to verify these calculations. strong improvement in resolution at acceleration voltage 80 kV measured. Our first C(c)-corrected experiments examining a (LaAlO(3))(0.3)(Sr(2)AlTaO(6))(0.7)/LaCoO(3) interface demonstrated significant gain...
Abstract For the transmission electron aberration-corrected microscope (TEAM) initiative of five U.S. Department Energy laboratories in United States, a correction system for simultaneous compensation primary axial aberrations, spherical aberration C s , and chromatic c has been developed successfully installed. The performance resulting / -corrected TEAM instrument investigated thoroughly. A significant improvement linear contrast transfer can be demonstrated. information about one obtains...
The achievable resolution of a modern transmission electron microscope (TEM) is mainly limited by the inherent aberrations objective lens. Hence, one major goal over past decade has been development aberration correctors to compensate spherical aberration. Such correction system now available and it possible improve with this corrector. When high in TEM required, important parameter, field view, also be considered. In addition, especially for large cameras available, compensation off-axial...
Journal Article A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope Get access Knut Urban, Urban * 1Institut für FestkörperforschungForschungszentrum Jülich GmbH, D-52425 *To whom correspondence should be addressed Search for other works by this author on: Oxford Academic PubMed Google Scholar Bernd Kabius, Kabius Max Haider, Haider 2CEOS GmbHIm Neuenheimer Feld 519, D-69 120 Heidelberg Harald Rose 3Institute Angewandte Physik, Technische...
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
After the introduction of hexapole Cs-correctors for scanning transmission electron microscopes (STEM), next big step forward was strong reduction six-fold astigmatism A5 by means an advanced design (DCOR/ASCOR). As a result all axial aberrations up to fifth order are sufficiently small allow large semi-aperture angles beyond 40 mrad energies in range 30 300 kV without deterioration STEM resolution. In this paper we derive simple expressions optimum strength minimum and size residual A5....
For HRSEM imaging of insulating specimens, thin “homogeneous” metal films with a thickness smaller than the SE-escape depth (1-2 nm for metals) and neglectable or very low BSE-coefficient (low Z e.g. Cr Ge), continuous enveloping surface fine structures, are supposed to reveal high resolution topographic SE-1 signal (Joy 1984). Hermann Müller (1991) have reported about 3-4 on freeze-dried biological coated at temperature (−80°C). High SE-images were also shown ft W sputter coated,...
Journal Article Applications of a Cs Corrected HRTEM in Materials Science Get access JL Hutchison, Hutchison Department Materials, Oxford University, Parks Road, Oxford, OX1 3PH, UK Search for other works by this author on: Academic Google Scholar JM Titchmarsh, Titchmarsh DJH Cockayne, Cockayne G Möbus, Möbus CJ Hetherington, Hetherington RC Doole, Doole F Hosokawa, Hosokawa JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196, Japan P Hartel, Hartel M Haider CEOS GmbH, Engelstr. 28,...
Extract Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – 9,
Abstract One of the limiting parameters in high-resolution transmission electron microscopy (HRTEM) are high values for spherical aberration Cs objective lens, which reason, that TEM's with field-emitter point resolution at Scherzer defocus is about two times lower than information limit. Another effect Cs-values one mm rather large disc least confusion, contributes to a amount contrast derealization. Furthermore images very sensitive towards beam tilt. These disadvantages contribute...
This study explores the bibliometric dynamics, publication trends, and scholarly landscape of library services research in Pakistan from 1991 to 2023. It aimed assess growth, collaboration, impact trends Pakistani research. 449 documents were retrieved Scopus database analyzed using analysis tool Biblioshiny. Findings have revealed significant growth output, collaborative endeavors, international recognition scholarship. However, a disparity between output citation uptake after 2011 was...
Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, Microscopy and Microanalysis 2004 Savannah, Georgia, USA, July 31 August 1, 2004.
Journal Article State of the Development a Cc & Cs Corrector for TEAM Get access M Haider, Haider CEOS,GmbH Search other works by this author on: Oxford Academic Google Scholar U Loebau, Loebau R Hoeschen, Hoeschen MPI Metals Research H Mueller, Mueller S Uhlemann, Uhlemann J Zach Microscopy and Microanalysis, Volume 13, Issue S02, 1 August 2007, Pages 1156–1157, https://doi.org/10.1017/S1431927607073412 Published: 05 2007
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – 7,
The research evaluated public libraries in Pakistan concerning their ICT resources, services and use of various tools service delivery. was quantitative relied on a survey to collect the necessary data. study’s population all country that were run by any department or directorate. A census-based done get information from whole population. data collected heads through questionnaire, then it analyzed with help SPSS version 23. governed bodies, variations also found nomenclature libraries’...
Abstract Selbst die einfachsten optischen Geräte liefern heute eine Qualität der Abbildung, von Elektronenoptiker bis vor kurzem nicht zu träumen wagten. Daß dies trotz Abbildungsfehler konventionellen Einzellinsen möglich ist, haben wir Ernst Abbe verdanken, bereits in den siebziger Jahren des vorigen Jahrhunderts gezeigt hat, wie man Sammel‐ und Zerstreuungslinsen einem Aplanaten anordnen kann, dem sich Fehler gegenseitig kompensieren. Dieses Verfahren versagt für runde Elektronenlinsen,...
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.