Chun Yu

ORCID: 0009-0000-1324-044X
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About
Contact & Profiles
Research Areas
  • Electronic Packaging and Soldering Technologies
  • High Entropy Alloys Studies
  • Welding Techniques and Residual Stresses
  • Additive Manufacturing Materials and Processes
  • High-Temperature Coating Behaviors
  • Advanced Welding Techniques Analysis
  • Advanced materials and composites
  • Hydrogen embrittlement and corrosion behaviors in metals
  • 3D IC and TSV technologies
  • Microstructure and Mechanical Properties of Steels
  • High Temperature Alloys and Creep
  • Metal and Thin Film Mechanics
  • Copper Interconnects and Reliability
  • Metal Alloys Wear and Properties
  • Intermetallics and Advanced Alloy Properties
  • Aluminum Alloys Composites Properties
  • Metallurgical and Alloy Processes
  • Boron and Carbon Nanomaterials Research
  • Aluminum Alloy Microstructure Properties
  • Chalcogenide Semiconductor Thin Films
  • 2D Materials and Applications
  • Semiconductor materials and interfaces
  • Nuclear Materials and Properties
  • MXene and MAX Phase Materials
  • Microstructure and mechanical properties

Shanghai Jiao Tong University
2016-2025

Purdue University West Lafayette
2024

Fujian Normal University
2024

Fujian Institute of Research on the Structure of Matter
2018-2022

National University of Singapore
2022

Chinese Academy of Sciences
2018-2022

Tianjin University
2022

Fuzhou University
2022

UNSW Sydney
2015-2018

Materials Science & Engineering
2015-2017

To accurately and quantitatively reveal the physical mechanism underlying formation of microstructure during coaxial powder-fed laser cladding, a three-dimensional comprehensive model, coupling laser-powder interaction, temperature field, flow is developed to identify effects multiphysics on characteristics. The high-speed camera numerical simulation are employed characterize powder distribution, which converted into corresponding cladding layer growth rate applied solve rise behavior molten...

10.1016/j.jmrt.2024.02.001 article EN cc-by-nc-nd Journal of Materials Research and Technology 2024-02-02

The strong effects of Zn addition on the reaction in Sn/Cu systems are widely known. Nevertheless, micro-mechanism for accumulation behavior, phase evolution and void formation Sn-xZn/Cu remain unclear. In this work, effect interface behavior is investigated. Structures prepared by between Sn-xZn solders (x = 0, 0.2, 0.5 0.8 wt.%) electroplated Cu (EP Cu) joints. During thermal aging Sn/EP joints, many voids formed inside Cu3Sn phase, especially close to Cu3Sn/EP interface. Whereas were...

10.1016/j.jmrt.2019.07.023 article EN cc-by-nc-nd Journal of Materials Research and Technology 2019-07-30

Refilled friction stir spot welding is proposed to replace solve the problem of keyhole in joining light metals. However, it rather challenging ensure mechanical property refilled joints because hook defect. In this study, a novel method was use graphene nanosheets strengthen tip defect and improve overall properties joint. The AA2014 aluminum alloy with 0.6%wt were fabricated by welding. results show that tensile/shear strength joint increases 31% fracture toughness also improved nearly 20%...

10.1016/j.matdes.2019.108212 article EN cc-by Materials & Design 2019-11-09

Vacuum hot-compression bonding (VHCB) is a promising solid-phase technology, but its feasibility and applicability in high entropy alloy (HEA) are still unclear. Herein, the VHCB process of CoCrFeMnNi HEA was investigated, interfacial quality comprehensively evaluated via microstructure characterization tensile test. Results exhibit that enables to obtain high-quality joints, excellent performance attributed dissolution oxide particles (IOPs) (MnCr2O4) migration grain boundaries (IGBs). The...

10.1016/j.jmrt.2023.06.112 article EN cc-by-nc-nd Journal of Materials Research and Technology 2023-06-16

Polyaniline (PANI) as a flexible matrix has been widely used in sensor applications, while the usage of pure PANI is hampered due to its insufficient electrical conductivity and limited surface...

10.1039/d5nj00239g article EN New Journal of Chemistry 2025-01-01

10.1016/j.microrel.2011.06.026 article EN Microelectronics Reliability 2011-07-25
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