A5053958642- Force Microscopy Techniques and Applications
- Atomic and Subatomic Physics Research
- Surface and Thin Film Phenomena
- Cell Image Analysis Techniques
- Advanced Materials Characterization Techniques
- Advanced MRI Techniques and Applications
- Molecular Junctions and Nanostructures
- Computer Graphics and Visualization Techniques
- Near-Field Optical Microscopy
- Diamond and Carbon-based Materials Research
- Graphene research and applications
- Optical Coherence Tomography Applications
- Quantum and electron transport phenomena
- Mechanical and Optical Resonators
- 2D Materials and Applications
- Quantum optics and atomic interactions
- Digital Holography and Microscopy
- Photonic and Optical Devices
University of Rostock
2024-2025
Czech Academy of Sciences, Institute of Physics
2025
Schott (Germany)
2020
Abstract We demonstrate three-dimensional magnetic resonance tomography with a resolution down to 5.9 ± 0.1 nm. Our measurements use lithographically fabricated microwires as source of field gradients, which we image NV centers in densely doped diamond by Fourier-accelerated tomography. also compressed sensing scheme, allows for direct visual interpretation without numerical optimization and implements an effective zoom into spatially localized volume interest, such cluster centers. It is...
We demonstrate dispersive readout of the spin an ensemble Nitrogen-Vacancy centers in a high-quality dielectric microwave resonator at room temperature. The state is inferred from reflection phase signal probing resonator. Time-dependent tracking demonstrated, and employed to measure T1 relaxation time ensemble. Dispersive provides interface solid spins, translating into shift. estimate that its sensitivity can outperform optical schemes, owing high accuracy achievable measurement phase....
Abstract Planar scanning probe microscopy is a recently emerging alternative approach to tip-based imaging. It can scan an extended planar sensor, such as polished bulk diamond doped with magnetic-field-sensitive nitrogen-vacancy (NV) centers, in nanometer-scale proximity of sample. So far, this technique has been limited optical near-field microscopy, and required nanofabrication the sample interest. Here we extend magnetometry using NV present modification that removes need for sample-side...
There is considerable evidence that action potentials are accompanied by "intrinsic optical signals", such as a nanometer-scale motion of the cell membrane. Here we present ChiSCAT, technically simple imaging scheme detects signals with interferometric sensitivity. ChiSCAT combines illumination {\bf ch}aotic speckle pattern and scattering microscopy ({\bf iSCAT}) to sensitively detect in any point direction. The technique features reflective high-NA illumination, common-path suppression...
There is considerable evidence that action potentials are accompanied by "intrinsic optical signals", such as a nanometer-scale motion of the cell membrane. Here we present ChiSCAT, technically simple imaging scheme detects signals with interferometric sensitivity. ChiSCAT combines illumination
Planar scanning probe microscopy is a recently emerging alternative approach to tip-based imaging. It can scan an extended planar sensor, such as polished bulk diamond doped with magnetic-field-sensitive nitrogen-vacancy (NV) centers, in nanometer-scale proximity of sample. So far, this technique has been limited optical near-field microscopy, and required nanofabrication the sample interest. Here we extend magnetometry using NV present modification that removes need for sample-side...
We demonstrate three-dimensional magnetic resonance tomography with a resolution down to 5.99 +- 0.07 nm. Our measurements use lithographically fabricated microwires as source of field gradients, which we image NV centers in densely doped diamond by Fourier-accelerated tomography. also present compressed sensing scheme for imaging spatially localized ensemble from undersampled data, allows direct visual interpretation without numerical optimization. The achieved our work approaches the...
Scanning probe microscopy (SPM) traditionally employs a sharp tip as sensor. This geometry is problem for many modern near-field probes, such NV centers in diamond, which cannot easily be placed on tip. Here we present novel, tipless approach - technique to scan planar parallel sample at distance of few tens nanometers. The core our scheme are optical far-field techniques measure both and tilt between the with sub-nm sub-mrad precision. These measurements employed feedback signal...