A5007291530- X-ray Spectroscopy and Fluorescence Analysis
- Advanced X-ray Imaging Techniques
- Electron and X-Ray Spectroscopy Techniques
- Diamond and Carbon-based Materials Research
- Ion-surface interactions and analysis
- Semiconductor materials and devices
- Metal and Thin Film Mechanics
- X-ray Diffraction in Crystallography
- Advanced Surface Polishing Techniques
- Advancements in Photolithography Techniques
- Optical Coatings and Gratings
- Thin-Film Transistor Technologies
- High-pressure geophysics and materials
- Particle Accelerators and Free-Electron Lasers
- Surface Roughness and Optical Measurements
- Magnetic properties of thin films
- Semiconductor materials and interfaces
- ZnO doping and properties
- Crystallography and Radiation Phenomena
- Silicon Nanostructures and Photoluminescence
- Integrated Circuits and Semiconductor Failure Analysis
- Copper Interconnects and Reliability
- Surface and Thin Film Phenomena
- Optical Systems and Laser Technology
- Laser-induced spectroscopy and plasma
Homi Bhabha National Institute
2016-2024
Raja Ramanna Centre for Advanced Technology
2015-2024
Bhabha Atomic Research Centre
2017-2021
Jawaharlal Nehru Centre for Advanced Scientific Research
2020
UGC DAE Consortium for Scientific Research
2011-2020
The University of Sydney
2020
Indian Institute of Technology Delhi
2011
Synchrotron soleil
2009-2010
We report soft x-ray reflectivity measurements near the Si L2,3 absorption edge for Si-rich silicon nitride thin film obtained by Hg-sensitized photochemical vapor deposition. demonstrate that precise analysis of optical index profile derived over extended energy region gives compositional details film. This nondestructive approach is used in to reveal buried interfacial layer. Further, combined study and density from fitting at various photon energies provide a qualitative estimation...
In the present study we report a new multilayer combination comprised of refracting layers niobium carbide and spacer silicon as more stable high reflecting for 10 - 20 nm wavelength region. The reflectivity is comparable to Mo/Si conventional mirrors. Annealing experiments carried out with NbC/Si at 600°C temperature showed ~2.5% drop in soft x-ray along marginal contraction period length. structure found after heat treatment. Crystallization responsible compaction length revealed by...
A versatile beamline for performing reflectivity, fluorescence, and absorption experiments in the soft x-ray region of 100–1500 eV is commissioned on a bending magnet port Indus-2 synchrotron source. high vacuum 2-axis reflectometer with x, y, z sample scanning stages installed. This used to measure reflectivity large samples up 300 mm length 5 kg weight. feature useful characterizing optical elements, such as mirrors, gratings, multilayers. flange mounted silicon drift detector installed...
Abstract In thin film multilayer based optical componentsof x-ray imaging system, diffusion of one material into the other degrades reflectivity mirrors severely. Along with this thermodynamically driven diffusion, there are also growth generated interface roughness different special frequencies and microstructures which can increase diffused scattering from reduce resolution an image. Generally grazing incidence in specular geometry (specular GIXR) measurement rocking scan yield information...
A soft x-ray reflectivity beamline covering 100 eV – 1500 photon energy range is designed, fabricated and commissioned at bending magnet port of Indian synchrotron radiation facility Indus-2 to cater thin film/ multilayer users analyze structural optical behavior. The experimental station designed test mirrors upto ∼300 mm length in the region. provides monochromatic photons using a constant deviation angle variable line spacing plane grating monochromator with Hettrick type optics. Pre post...
A study on effective laser cleaning of gold layer deposited fused silica substrates used in beamlines synchrotron radiation (SR) sources using nanosecond-pulsed Nd:YAG has been carried out. The influence pulse duration, beam incidence angle, spot overlapping, fluence, and number passes efficiency investigated. An approximately 48 nm thick from a mirror surface area ~48 cm2 cleaned 3 min. Laser clean quality analyzed microscope, scanning electron microscope (SEM), angle-dependent reflectivity...
We report a detailed study of surface and interface properties pulsed-laser-deposited NiMnSb films on Si(100) substrate as function film thickness. As the thickness is reduced below $35\phantom{\rule{0.3em}{0ex}}\mathrm{nm}$, formation porous layer observed. Porosity in this increases with decrease These morphological changes ultrathin are reflected interesting transport magnetic these films. Compositional anomaly roughness not source
The objectives of this project is install at the 2.75 GeV SOLEIL synchrotron radiation source a calibration and metrology test facility for R&D optical components detectors. We have build, on bending magnet, two branches to cover an energy range from few eV 28 keV give access white beam. This installation will first address needs experimental groups (Optics Detectors) be used by large community. beamline also valuable as general‐purpose prepare, set up wide experiments in field Astrophysics,...
The optical constants of indium phosphide (InP) in the soft x-ray region 50-200 Å are determined from angle-dependent reflectivity measurements. measurements carried out using beam line at Indus-1 synchrotron source. derived compared with tabulated values Henke et al. [At. Data Nucl. Tables 54, 181 (1993)]. Experimental δ and β close agreement lower wavelength 50-120 Å. experimental value indicates an edge shift 0.4 toward side phosphorous L-edge 92 However, above 120 region, where N(2)...
Use of a grating monochromator causes problem higher harmonic contaminations in synchrotron beamline operating the soft x ray/vacuum ultraviolet region. Generally gratings are used to experimentally determine contaminations. In this method, relative contribution contaminant wavelengths is measured with respect first wavelength (desired wavelength). The quantitative fit spectra rather complex, and therefore qualitative analysis carried out. Analysis multilayer reflectivity data has become...
The DC magnetron sputter grown Co/Ti multilayers, with ultra-low bi-layer thicknesses and Co layers deposited under mixed ambience of argon dry air, have been investigated for use in the water window soft x-ray regime 23-44 Å. Initially, deposition parameters optimized obtaining smooth continuous low thickness Ti single-layer films, and, then, multilayers five bi-layers various were deposited. samples primarily characterized by grazing incidence reflectivity (GIXR) measurements a hard...