Pei-Hsuan Lee

ORCID: 0000-0001-6767-6046
Publications
Citations
Views
---
Saved
---
About
Contact & Profiles
Research Areas
  • Industrial Vision Systems and Defect Detection
  • Integrated Circuits and Semiconductor Failure Analysis
  • VLSI and Analog Circuit Testing
  • Image and Object Detection Techniques
  • Anomaly Detection Techniques and Applications

National Yang Ming Chiao Tung University
2021

Many automated optical inspection (AOI) companies use supervised object detection networks to inspect items, a technique which expends tremendous time and energy mark defectives. Therefore, we propose an AOI system uses unsupervised learning network as the base algorithm simultaneously generate anomaly alerts reduce labeling costs. This works by deploying GANomaly neural manufacturing system. To improve ability distinguish items from normal in industry enhance overall performance of process,...

10.3390/cryst11091048 article EN cc-by Crystals 2021-08-31
Coming Soon ...