A5082992962- Radiation Effects in Electronics
- Radiation Detection and Scintillator Technologies
- Radiation Therapy and Dosimetry
- Particle Detector Development and Performance
- Spacecraft Design and Technology
- Graphite, nuclear technology, radiation studies
- Space Technology and Applications
- Parallel Computing and Optimization Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Nuclear Physics and Applications
- Nuclear reactor physics and engineering
- Semiconductor materials and devices
- CCD and CMOS Imaging Sensors
- Particle accelerators and beam dynamics
- VLSI and Analog Circuit Testing
- Distributed Control Multi-Agent Systems
- Distributed systems and fault tolerance
- Robotic Path Planning Algorithms
- Adaptive Control of Nonlinear Systems
- Power Line Communications and Noise
- Gyrotron and Vacuum Electronics Research
- Real-Time Systems Scheduling
- IoT and Edge/Fog Computing
- Particle Accelerators and Free-Electron Lasers
- Satellite Communication Systems
European Space Research and Technology Centre
2017-2024
European Space Agency
2022
European Organization for Nuclear Research
2017-2021
University of Jyväskylä
2016-2018
The R2E project at CERN has tested a few commercial SRAMs and custom-designed SRAM, whose data are complementary to various scientific publications. experimental include low- high-energy protons, heavy ions, thermal, intermediate- neutrons, electrons pions.
Proton direct ionization (PDI) from low-energy protons has been shown to have a potentially significant impact on the accuracy of prediction methods used calculate upset rates (URs) memory devices in space applications for state-of-the-art deep submicron technologies. The general approach nowadays is consider safety margin apply over UR computed high-energy proton and heavy-ion experimental data. data reported here present challenge this approach. Different are compared order establish PDI...
We present experimental evidence of electron-induced upsets in a reference European Space Agency (ESA) single event upset (SEU) monitor, induced by 200-MeV electron beam at the Very energetic Electronic facility for Planetary Exploration harsh Radiation environments CERN. Comparison cross sections and simulated is shown differences are analyzed. Possible secondary contributions to rate neutrons, flash effects, cumulative dose effects discussed, showing that electronuclear reactions expected...
Traditional heavy-ion testing for single-event effects is carried out in cyclotron facilities with energies around 10 MeV/n. Despite their capability of providing a broad range linear energy transfer (LET) values, the main limitations are related to need vacuum and sensitive region components accessible low ions. In this paper, we explore use ultrahigh (UHE) (5-150 GeV/n) ions CERN accelerator complex radiation on electronics testing. At these energies, show, both through simulations...
In addition to high-energy hadrons, which include neutrons, protons, and pions above 20 MeV, thermal neutrons (ThNs) are a major concern in terms of soft error rate (SER) for electronics operating the large hadron collider (LHC) accelerator at European Organization Nuclear Research (CERN).Most electronic devices still contain Boron-10 inside their structure, makes them sensitive ThNs.The LHC radiation environment different tunnel shielded areas is analyzed through measurements FLUKA...
Taking advantage of the heavy ion acceleration program, tests on radiation effects with Ultrahigh Energy (UHE) xenon beams (with > 5 GeV/nucleon) have been performed in several experimental areas CERN accelerator complex. Specifically, outcomes first UHE test campaign carried out at CHARM facility are presented and discussed this contribution. not requiring a previous modification samples or testing vacuum, owing to their large penetration range. The unique nature ions motivated study...
Single event effect (SEE) testing with ultrahigh energy (UHE) heavy ions, such as the beams provided at CERN, presents advantages related to their long ranges a constant linear transfer value. In present work, possibility test components in parallel is being examined, and results from CERN 2018 UHE Pb campaigns are studied. Furthermore, generation of multibit upsets by ions evaluated, contribution possible fragments SEE measurements discussed.
Φ-Sat-1 is part of the European Space Agency initiative to promote development disruptive innovative technology and capabilities on-board EO missions. The Φ-Sat-l satellite represents first-ever Artificial Intelligence (AI) deep Convolutional Neural Network (CNN) inference on a dedicated chip attempting exploit artificial Deep (DNN) capability for Earth Observation. It utilises Myriad Vision Processing Unit (VPU), System On Chip (SOC) that has been designed ex novo high-performance edge...
CERN provides unique irradiation facilities for applications in dosimetry, metrology, intercomparison of radiation protection devices, benchmark Monte Carlo codes and damage studies to electronics.
We investigate, through measurements and simulations, the possible direct ionization impact on accelerator soft-error rate (SER), not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the-art commercial components 65-16-nm technological range, indirect is still expected to dominate overall SER mixed-field. However, derived critical charges most sensitive parts, corresponding ~0.7 fC, are be at limit rapid dominance increase.
We perform Monte Carlo (MC) simulations to describe heavy ion (HI) nuclear interactions in a broad energy range (4 MeV/n-150 GeV/n), focusing on the single event effect (SEE) sub-linear transfer (LET) impact. Previously retrieved latch-up (SEL) experimental data have indicated that standard ions (~10 MeV/n) can produce high-LET secondaries through fusion reactions which are expected strongly influence SEE cross section sub-LET region. Alternatively, of higher (>100 yield similar LET...
In this paper we characterise two embedded GPU devices from the NVIDIA Xavier family System-on-Chip (SoC) using a proton beam. We compare NX and Industrial devices, that respectively target commercial automotive applications. evaluate Single-Event Effect (SEE) rate of both modules their sub-components, CPU GPU, different power modes, try for first time to identify exact sources on-line testing facilities included in ARM based system. Our conclusion is most sensitive part complex SoC tag...
Heavy-Ion irradiation of a Xilinx Ultrascale+ MPSOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally, with ultra high energy xenon beam shows similar upset sensitivity.
A 24-GeV proton beam is available at the Cern High energy AcceleRator Mixed field facility which can be used to test components and boards for single-event effects (SEEs) a worst case both accelerator interplanetary space applications. The main characteristics are described, SEE results three different presented in combination with Monte Carlo results, focusing on significant dependence, risk of underestimating operational error rate hard spectral environments when considering cross sections...
CERN provides unique irradiation facilities for applications in many scientific fields. This paper summarizes the currently operating proton, gamma, mixed-field and electron irradiations, including their main usage, characteristics information about operation. The new database is also presented. includes not only but available worldwide.
The new CERN Linear Electron Accelerator for Research (CLEAR) facility at started its operation in fall 2017. CLEAR results from the conversion of CALIFES beam line former CLIC Test Facility (CTF3) into a testbed general accelerator R&D and component studies existing possible future applications. can provide stable reliable electron 60 to 220 MeV single or multi bunch configuration 1.5 GHz. experimental program includes high gradient acceleration methods, e.g. X-band plasma technology,...
In this paper, possible mechanisms by which electrons can induce single-event latchups in electronics are discussed. The energy deposition and the nuclear fragments created silicon analyzed context. cross section enhancement effect presence of high-Z materials is First experimental results electron-induced shown static random access memory devices with low linear transfer thresholds. radiation hardness assurance implications future work
In this paper, we perform an in-depth analysis of the single-event effects observed during testing at medical electron linacs and experimental high-energy linac. For irradiations, are most commonly used due to their availability flexibility. Whereas previous efforts were made characterize cross sections higher energies, where nuclear interaction section is higher, focus paper on complete overview relevant energies. Irradiations linac with two different devices, a large difference in feature...
The use of System-on-Chip (SoC) solutions in the design space-borne data handling systems is an important step towards further miniaturization space. In cubesats and many aggressive commercial missions, Commercial-Off-The-Shelf (COTS) components becoming rule, rather than exception those are complex SoC, multiprocessor system-on-chip (MPSoC), SiP (System package) or AMS-SoC (Analog/Mixed Signal SoC). Those changes triggering attempts to modify way we approach conduct radiation tolerance...
The SEE sensitivity of electronic devices to high energy electrons has been put in evidence experimentally. Several ground experiments have shown that electron induced could occur recent technologies. In the case JUICE mission, expected environment is harsher than for Earth orbits. impact such fluxes on embedded electronics was assessed this work. study focused SRAM memories SEU sensitivity. Three different device references were tested under electrons, as well protons and heavy ions. low...
We present experimental evidence of electron induced upsets in a reference ESA SEU monitor, the based particle detector, by 200 MeV beam at VESPER facility CERN. Comparison cross sections and simulated are shown differences analyzed. Possible secondary contributions to upset rate neutrons cumulative dose effects discussed, showing that electronuclear reactions expected mechanism. Insight is given as possible overall contribution rates Jovian radiation environment inside typical spacecraft...
Recent trends in Data Handling Systems (DHS) include increased data-rates, in-orbit reconfiguration and the introduction of advanced On-Board Processing (OBP) methods to extract actionable information on-board, with low latency. At same time, NewSpace industry has successfully deployed COTS-based DHS processing equipment space. In particular for OBP, processors FPGAs can offer higher computational performances than space qualified equivalents – which turn enable new applications through more...
Aiming at the formation and maintenance problem of UAVs in an obstacle environment, a distributed model predictive control (DMPC) algorithm with no reference trajectory considering system constraints is proposed. In order to deal constraint coupling cost existing (MPC), assumed introduced design low conservative compatibility function trajectory, so that can be executed synchronous manner. Secondly, terminal designed based on speed barrier method ensure safety domain, feasible input given....