A5022466397- Electron and X-Ray Spectroscopy Techniques
- Semiconductor materials and devices
- Graphene research and applications
- Diamond and Carbon-based Materials Research
- Ion-surface interactions and analysis
- Electronic and Structural Properties of Oxides
- Advanced Electron Microscopy Techniques and Applications
- Advanced Materials Characterization Techniques
University of Vienna
2019-2023
Austrian Centre for Electron Microscopy and Nanoanalysis
2017
Abstract Understanding electron irradiation effects is vital not only for reliable transmission microscopy characterization, but increasingly also the controlled manipulation of 2D materials. The displacement cross sections monolayer hexagonal boron nitride (hBN) are measured using aberration‐corrected scanning in near ultra‐high vacuum at primary beam energies between 50 and 90 keV. Damage rates below 80 keV up to three orders magnitude lower than previously edges under poorer residual...
Abstract Substituting heteroatoms into graphene can tune its properties for applications ranging from catalysis to spintronics. The further recent discovery that covalent impurities in be manipulated at atomic precision using a focused electron beam may open avenues towards sub-nanometer device architectures. However, the preparation of clean samples with high density dopants is still very challenging. Here, we report vacancy-mediated substitution aluminium laser-cleaned graphene, and...
Although surface diffusion is critical for many physical and chemical processes, including the epitaxial growth of crystals heterogeneous catalysis, it particularly challenging to directly study. Here, we estimate carbon adatom migration barrier on freestanding monolayer graphene by quantifying its temperature-dependent electron knock-on damage. Due fast healing vacancies diffusing adatoms, damage rate decreases with increasing temperature. By analyzing observed rates at 300-1073 K using a...
Since the possibility to manipulate lattice impurity atoms using a focused electron beam in scanning transmission microscope was discovered 2014 [1] and first experimentally demonstrated graphene 2017 [2,3], progress has been made extend manipulation different elements even other materials including single-walled carbon nanotubes bulk silicon, as discussed recent review [4].However, despite advances automation machine-learning, scaling up of technique build atomically precise patterns out...
Journal Article Automated Real-time Analysis of Atomic-resolution STEM Images Get access Jacob Madsen, Madsen Faculty Physics, University Vienna, Austria Corresponding author: jacob.madsen@univie.ac.at Search for other works by this author on: Oxford Academic Google Scholar Andreas Postl, Postl Toma Susi Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 166–167, https://doi.org/10.1017/S1431927619001569 Published: 01 2019
Although surface diffusion is critical for many physical and chemical processes, including the epitaxial growth of crystals heterogeneous catalysis, it particularly challenging to directly study. Here, we estimate carbon adatom migration barrier on freestanding monolayer graphene by quantifying its temperature-dependent electron knock-on damage. Due fast healing vacancies diffusing adatoms, damage rate decreases with increasing temperature. By analyzing observed rates at 300– 1073 K using a...
Journal Article Adventures in Atomic Resolution situ STEM Get access Andreas Postl, Postl University of Vienna, Faculty Physics, Austria Search for other works by this author on: Oxford Academic Google Scholar Thuy An Bui, Bui Fabian Kraft, Kraft Alexandru Chirita, Chirita Gregor Leuthner, Leuthner Heena Inani, Inani Clemens Mangler, Mangler Kimmo Mustonen, Mustonen Jani Kotakoski, Kotakoski Toma Susi Corresponding author: toma.susi@univie.ac.at Microscopy and Microanalysis, Volume 28, Issue...
Understanding electron irradiation effects is vital not only for reliable transmission microscopy characterization, but increasingly also the controlled manipulation of two-dimensional materials. The displacement cross sections monolayer hBN are measured using aberration-corrected scanning in near ultra-high vacuum at primary beam energies between 50 and 90 keV. Damage rates below 80 keV up to three orders magnitude lower than previously edges under poorer residual conditions where chemical...
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