Mark McLean

ORCID: 0000-0003-0336-5972
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About
Contact & Profiles
Research Areas
  • Advanced Materials Characterization Techniques
  • Electron and X-Ray Spectroscopy Techniques
  • Advanced Surface Polishing Techniques
  • Hydrogen embrittlement and corrosion behaviors in metals
  • Force Microscopy Techniques and Applications
  • Metal and Thin Film Mechanics
  • Metallurgy and Material Forming
  • Mechanical and Optical Resonators
  • Microstructure and mechanical properties
  • Microstructure and Mechanical Properties of Steels
  • Solid State Laser Technologies
  • Laser Material Processing Techniques
  • Ion-surface interactions and analysis
  • Advanced MEMS and NEMS Technologies
  • Integrated Circuits and Semiconductor Failure Analysis
  • Glass properties and applications
  • Advanced Electron Microscopy Techniques and Applications
  • Radioactive element chemistry and processing
  • Advanced Fluorescence Microscopy Techniques
  • High-Velocity Impact and Material Behavior
  • Advanced Chemical Sensor Technologies
  • Structural Response to Dynamic Loads
  • Particle Detector Development and Performance
  • Corrosion Behavior and Inhibition
  • Fusion materials and technologies

Material Measurement Laboratory
2015-2025

National Institute of Standards and Technology
2015-2024

Lehigh University
2010-2019

Lawrence Livermore National Laboratory
1999

Naval Sea Systems Command
1994

The University of Texas Health Science Center at San Antonio
1993

Abstract The Beam Gas Ionisation (BGI) profile monitor, located in the Proton Synchrotron (PS) and Super (SPS) at CERN, requires a radiation-tolerant readout system to transfer data from challenging accelerator surroundings back-end for processing. needs control acquire four Timepix3 Hybrid Pixel Detectors (HPDs) directly inside beam pipe, highly radioactive environment. It must ensure reliability given limited hardware access preserve signal integrity high-speed (32 channels 320 MHz)....

10.1088/1748-0221/20/02/c02009 article EN cc-by Journal of Instrumentation 2025-02-01

Frequency Domain Thermoreflectance (FDTR) is a versatile technique used to measure the thermal properties of thin films, multilayer stacks, and interfaces that govern performance management in semiconductor microelectronics. Reliable property measurements at these length scales (≈10 nm ≈10 μm), where physics transport phonon scattering both grow complexity, are increasingly relevant as electronic components continue shrink. While FDTR promising technique, instruments generally home-built;...

10.1063/5.0213738 article EN Review of Scientific Instruments 2024-10-01

This letter reports on pilot tests of microfabricated nanocalorimeters as a metrology platform for rapid (<40 ms response time) and sensitive (in the range 1020 m−2 s−1–1017 m−3 radicals’ flux density, respectively) detection neutral radicals generated by reactive cold plasmas. The setup consists nanocalorimeter resistive sensor coated with catalyst alongside an inert reference identical thermal masses. By measuring temperature increase in active caused radical surface recombination...

10.1116/6.0004294 article EN Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena 2025-02-04

Thin metal films acting as structural components in microelectromechanical systems (MEMS) devices can exhibit viscoelastic mechanical behavior even at small strains, causing time-dependent changes device performance. In an effort to characterize the temperature dependence of this behavior, stress relaxation experiments using gas pressure bulge testing have been conducted on 1.0-μm thick Au temperatures between 20°C and 80°C. By fitting a Prony series saturating exponentials resulting curves,...

10.1109/jmems.2010.2076787 article EN Journal of Microelectromechanical Systems 2010-10-08

Atom probe tomography (APT)-based isotopic analyses are becoming increasingly attractive for analysis applications requiring small volumes of material and sub-micrometer length scales, such as isotope geochemistry, nuclear safety, materials science. However, there is an open question within the atom community to reliability elemental analyses. Using our proposed guidelines, in conjunction with empirical calibration curve a machine learning-based adaptive peak fitting algorithm, we...

10.1021/acs.analchem.0c02273 article EN cc-by Analytical Chemistry 2020-07-22

Laboratory notebooks have been a staple of scientific research for centuries organizing and documenting ideas experiments.Modern laboratories are increasingly reliant on electronic data collection analysis, so it seems inevitable that the digital revolution should come to ordinary laboratory notebook.The most important aspect this transition is make shift as comfortable intuitive possible, creative process hallmark investigation engineering achievement maintained, ideally enhanced.The smart...

10.6028/jres.120.018 article EN publisher-specific-oa Journal of Research of the National Institute of Standards and Technology 2015-12-01

Abstract Scanning transmission electron microscope (STEM) through-focus imaging (TFI) has been used to determine the three-dimensional atomic structure of Bi segregation-induced brittle Cu grain boundaries (GBs). With TFI, it is possible observe single atom distributions along [001] twist GBs using an aberration-corrected STEM operating at 200 kV. The depth resolution ~5 nm. Specimens with intentionally inclined respect microscope’s optic axis were investigate segregant and through GB. It...

10.1017/s1431927616000696 article EN Microscopy and Microanalysis 2016-05-05

The NIF and LMJ laser systems require about 3380 4752 Nd-doped glass slabs, respectively. Continuous melting forming will be used for the first time to manufacture these slabs. Two vendors have been chosen produce glass: Hoya Corporation Schott Glass Technologies. that each of two designed, built tested are arguably most advanced in world. Production begin on a pilot scale fall 1998.

10.1117/12.354192 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 1999-07-23

An abstract is not available for this content so a preview has been provided. As you have access to content, full PDF via the 'Save PDF' action button.

10.1017/s1431927621001239 article EN Microscopy and Microanalysis 2021-07-30

Journal Article A Standards-based Approach to Dopant Quantification Using Atom Probe Tomography Get access Karen DeRocher, DeRocher National Institute of Standards and Technology, Gaithersburg, Maryland, United States Corresponding author: karen.derocher@nist.gov Search for other works by this author on: Oxford Academic Google Scholar Mark McLean, McLean Fred Meisenkothen Microscopy Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 728–729, https://doi.org/10.1017/S1431927622003373...

10.1017/s1431927622003373 article EN Microscopy and Microanalysis 2022-07-22

Journal Article Towards Accurate and Reproducible Uranium Isotopic Analysis via Atom Probe Mass Spectrometry Get access Frederick Meisenkothen, Meisenkothen National Institute of Standards Technology, Gaithersburg, Maryland, United States Search for other works by this author on: Oxford Academic Google Scholar Mark McLean, McLean Irina Kalish, Kalish MATSYS, Inc., Sterling, Virginia, Daniel Samarov, Samarov Eric Steel Microscopy Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages...

10.1017/s1431927620013689 article EN Microscopy and Microanalysis 2020-07-30

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – 8, 2013.

10.1017/s1431927613010684 article EN Microscopy and Microanalysis 2013-08-01

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

10.1017/s1431927612003583 article EN Microscopy and Microanalysis 2012-07-01

3 shows the (a) measured and (b) simulated shear strain, ε12, clearly illustrates these gradients, as well agreement between experimental FEA results.

10.1017/s1431927617004330 article EN Microscopy and Microanalysis 2017-07-01

ABSTRACT A modal test of the John Paul Jones (DDG‐53) mainmast structure and mast‐mounted antennas was conducted. The part a larger effort to accurately determine dynamic characteristics “as‐built” mast/antenna system survivability in vibration underwater explosion (UNDEX) shock environment. Previous mathematical analysis DDG‐51 class mast predicted response acceleration levels during trials scenario be excessive some areas. results now provide, however, confirmed including mode shapes,...

10.1111/j.1559-3584.1994.tb02826.x article EN Naval Engineers Journal 1994-03-01
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