Preface. 1. The polarization of light waves. 2. Propagation polarized through polarizing optical systems. 3. Theory and analysis measurements in ellipsometer 4. Reflection transmission by stratified planar structures. 5. Instrumentation techniques ellipsometry. 6. Applications Appendix. Author index. Subject

All 16 elements of the Mueller matrix an optical system (sample) can be encoded onto, hence retrieved from, a single detected signal using class photopolarimeters with modulated polarizing and analyzing optics. The general theory operation such polarimeters is presented. We also propose specific new photopolarimeter whose optics are by synchronously rotating two quarter-wave retarders at angular speeds ω 5ω. When light flux leaving polarimeter linearly detected, periodic J=a0+∑n=112(an cos...

The Nature of Light. Polarization Properties Devices for Control Polarized Introduction to the Jones Calculus, Mueller Calculus and Poincare Sphere. Sphere Revisited. Spectroscopy with Orientation Photoselection Effects. Light in Condensed Phases. Appendixes. Index.

This paper reviews the current status of instruments for measuring full 4×1 Stokes vector S, which describes state polarization (SOP) totally or partially polarized light, and 4×4 Mueller matrix M, determines how SOP is transformed as light interacts with a material sample an optical element system. The principle operation each instrument briefly explained by using Stokes-Mueller calculus. development fast, automated, imaging, spectroscopic over last 50 years has greatly expanded range...

We extend the scope of Mueller calculus to parallel that established by Jones for his calculus. find Stokes vector S a light beam propagates through linear depolarizing anisotropic medium obeys first-order differential equation dS/dz = mS, where z is distance traveled along direction propagation and m 4 × real matrix summarizes optical properties which influence vector. determine eight basic types behavior, its form most general nondepolarizing medium, relationship complex 2 matrix. solve...

The seven participating laboratories received films of two different thicknesses Sc2O3 and Rh. All samples each material were prepared in a single deposition run. Brief descriptions are given the various methods used for determination optical constants these coating materials. measurement data presented, results compared. mean variances refractive-index determinations 0.40–0.75-nm spectral region was 0.03. corresponding refractive index absorption coefficient Rh 0.35 0.26, respectively.

Abstract To measure all four Stokes parameters of a light beam simultaneously, the is divided into separate beams using beamsplitter and two Wollaston prisms. Linear detection fluxes component gives signals that determine parameters. This division-of-amplitude photopolarimeter (DOAP) completely characterized by wavelength-dependent 4 2 matrix can be determined directly calibration. The instrument has fast response (that limited only photodetectors) as it no moving parts or modulation. Notes...

A new photopolarimeter for the simultaneous measurement of all four Stokes parameters light is described. The beam, whose state polarization to be determined, strikes at oblique incidence three photodetector surfaces in succession, each which partially specularly reflecting and generates an electrical signal proportional fraction radiation that it absorbs. fourth captures remainder light. outputs thus developed form a 4 × 1 vector I, linearly related, I = AS, input S. Consequently, S...

The four-detector photopolarimeter (FDP) is analyzed for an arbitrary spatial configuration and any reflection characteristics (ri, ψi, Δi,) of the first three detectors. instrument matrix A, which relates output signal vector I to input Stokes S by = AS, its determinant are derived explicitly. essential condition that A be nonsingular (det ≠ 0) satisfied in general with uncoated absorbing detector surfaces, assuming plane incidence (POI) rotated between successive reflections other than...

The first three columns of the instrument matrix A four-detector photopolarimeter (FDP) are determined by Fourier analysis output current vector I(P) as a function azimuth angle P incident linearly polarized light. Therefore 12 16 elements measured free imperfections (absent) quarter-wave retarder (QWR). effect angular beam deviation polarizer is compensated for taking average, (1/2) [I(P) + I(P 180°)], FDP at 180°-apart, optically equivalent, positions polarizer. remaining fourth column...

When a single complex variable χ is used to specify the ellipse of polarization light passing through an anisotropic medium, first-order, second-degree, ordinary differential equation (Riccati's equation) governs evolution with distance along direction propagation. In this properties medium are represented by elements nij its N-matrix, which was first introduced Jones. Its solution χ(z,χ0) represents trajectory in plane traversed as z increased, starting from initial χ0 at = 0. A...

Get PDF Email Share with Facebook Tweet This Post on reddit LinkedIn Add to CiteULike Mendeley BibSonomy Citation Copy Text R. M. A. Azzam and N. Bashara, "Generalized Ellipsometry for Surfaces Directional Preference: Application Diffraction Gratings*," J. Opt. Soc. Am. 62, 1521-1523 (1972) Export BibTex Endnote (RIS) HTML Plain alert Save article

The polarization properties of the various diffracted orders from a grating are determined ellipsometrically. ratio ${\ensuremath{\rho}}_{m}$ far-field complex reflection coefficients for $p$ and $s$ polarizations any order $m$ is measured. This information complementary to data available partition scattered energy over radiating orders. By examining specularly reflected zeroth-order beam at large angles incidence optical effect surface roughness established. roughened layer shown be...

Polarization properties of the corner-cube retroreflector are discussed theoretically by use ray tracing and analytical geometry. The Jones matrices eigenpolarizations six propagation trips derived. An experiment is also set up for determination linear output states polarization incident linearly polarized light. experimental results consistent with theoretical expectations.

A computer-controlled four-detector photopolarimeter (FDP) has been constructed using four windowless planar-diffused Si photodiodes, operational amplifiers, an analog-to-digital (A/D) converter, and a personal computer with peripherals. nonplanar light path is selected incidence angles at the first three detectors of ∼65° rotations ∼45° between successive planes incidence. The last detector, which coated for minimum reflectance, intercepts beam small angle residual it reflects dumped. 1-mW...

The polarization states of light incident on and emerging from an optical system are represented by complex numbers χ¯ ξ¯, respectively, in two different planes. In this representation, the input–output transfer function ξ¯=f(χ¯) is a conformal bilinear transformation with coefficients given elements system’s Jones matrix. From known properties transformation, important conclusions can be reached response systems to all possible forms. addition, analysis appears have considerable potential...

The ratio ρ = Rp/Rs of the complex amplitude-reflection coefficients Rp and Rs for light polarized parallel (p) perpendicular (s) to plane incidence, reflected from an optically isotropic film–substrate system, is investigated as a function angle incidence ϕ film thickness d. Both constant-angle-of-incidence contours (CAIC) constant-thickness (CTC) ellipsometric ρ(ϕ,d) in are examined. For transparent films, periodic d with period Dϕ that ϕ. given (0 ≤ 90, 0 < Dϕ), equispaced linear array...

The technique of generalized ellipsometry is briefly reviewed. An improved criterion for computing the normalized 2 × complex reflection matrix an anisotropic surface from multiple-null ellipsometer measurements (in excess three) given. Generalized ellipsometry, together with recently developed 4 4-matrix methods study and transmission polarized light by stratified media, provide basic tools to carry out interpret ellipsometric on structures. As example, case uniaxial (absorbing) crystals,...

Coupling constants are introduced that determine the extent to which a component imperfection, window birefringence, or azimuth-angle error couple cause an of specimen reflectance ratio. A unified scheme for treating these sources is presented. By expressing coupling as functions nulling angles, any methods can be considered. Results presented compensator at ±π/4 and by polarizer analyzer, show contributions different ψ Δ in four ellipsometry zones. The limitations one- two-zone measurements...

Chiral thin solid films (CTSFs) can be deposited on a substrate in vacuum by letting vapor stream of film material impinge the at oblique incidence and rotating during deposition. The direction rotation determines handedness resulting helical structure which resembles that cholesteric or twisted-nematic liquid crystal layer. CTSFs are useful making new optical rotators beam splitters separate orthogonal circular polarization components light. A quadrant-detector ellipsometer uses chiral...

The absolute, average, and differential phase shifts that p- s-polarized light experience in total internal reflection (TIR) at the planar interface between two transparent media are considered as functions of angle incidence ϕ. Special angles which quarter-wave achieved determined relative refractive index N. When average shift equals π/2, Δ is maximum, Jones matrix assumes a simple form. For N>3, equal (hence δp=3 δs) certain ϕ function All rise with infinite slope critical angle. limiting...

We have found a significant relation, rp = rs(rs − cos2ϕ)/(1 rs cos2ϕ), between Fresnel's interface complex-amplitude reflection coefficients and for the parallel (p) perpendicular (s) polarizations at same angle of incidence ϕ. This relation is universal in that it applies to all interfaces homogeneous isotropic media collectively and, course, throughout electromagnetic spectrum. investigate properties this function, f(rs), its inverse, g(rp) conformal mappings complex planes rp. A related...

Conventional ellipsometry is extended to determine the polarization transfer function of any optical system. Only three null measurements are needed complex parameters that define function. More can be taken overdetermine unknown parameters, reduce effect various sources error in ellipsometer. The conditons for compensation (the existence a null) defined. A system composed retardation plate and mirror measured demonstrate aspects theory illustrate application method. This technique makes it...