A5070968028- Advanced Electron Microscopy Techniques and Applications
- Electron and X-Ray Spectroscopy Techniques
- Machine Learning in Materials Science
- Integrated Circuits and Semiconductor Failure Analysis
- Research Data Management Practices
- Optical Coatings and Gratings
- Advancements in Battery Materials
- Supercapacitor Materials and Fabrication
- Scientific Computing and Data Management
- Electromagnetic Simulation and Numerical Methods
- Advanced Battery Materials and Technologies
- solar cell performance optimization
- Electromagnetic Scattering and Analysis
Trinity College Dublin
2019-2024
Advanced Materials and BioEngineering Research
2022
Scanning transmission electron microscopy (STEM), where a converged probe is scanned over sample's surface and an imaging, diffraction, or spectroscopic signal measured as function of position, extremely powerful tool for materials characterization. The widespread adoption hardware aberration correction, direct detectors, computational imaging methods have made STEM one the most important tools atomic-resolution science. Many these rely on accurate diffraction simulations in order to...
Journal Article The User Adjustable Pole-piece: Expanding TEM Functionality Without Compromise Get access Patrick McBean, McBean School of Physics, Trinity College Dublin, IrelandAdvanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures & Nanodevices (CRANN), Ireland Search other works by this author on: Oxford Academic Google Scholar Pat Murphy, Murphy Ryusuke Sagawa, Sagawa JEOL Ltd., Akishima, Toyko, Japan Lewys Jones Corresponding author: lewys.jones@tcd.ie and...
Journal Article Multiphysics Simulation for TEM Objective Lens Evaluation & Design Get access Patrick McBean, McBean School of Physics, Trinity College Dublin, IrelandAdvanced Microscopy Laboratory, Centre Research on Adaptive Nanostructures Nanodevices (CRANN), Ireland Search other works by this author on: Oxford Academic Google Scholar Zachary Milne, Milne Center Integrated Nanotechnologies, Sandia National Laboratories. Albuquerque, NM, United States Arjun Kanthawar, Kanthawar Khalid...
Low-voltage transmission electron microscopy (≤80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can be corrected for a scanning microscope (STEM); however, chromatic then dominate, limiting the ultimate resolution of microscope. Using image simulations, we examine how corrector, different objective lenses, and beam energy spreads each affect quality gold...
The transmission electron microscope (TEM) has become an essential tool for innovation in nanoscience, material science, and biology. Despite these instruments being widely used across both industry academia, academics may hesitate to propose substantial modifications the optical setup due instrument's significant purchase price, fear of voiding service contract, or downtime unacceptable shared user facilities. For found industry, similarly risk-reward balance makes substantive untenable....