Sheng Shen

ORCID: 0000-0003-1977-9838
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About
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Research Areas
  • Semiconductor materials and devices
  • Ferroelectric and Negative Capacitance Devices
  • Advanced Memory and Neural Computing

Shanghai Jiao Tong University
2024

The gradual, abrupt, and abnormal reset transitions have been experimentally demonstrated in resistive random access memories (RRAMs). Yet a compact model that could well explain reproduce the various observed phenomena is still under active exploration due to physical processes involved. In this study, we develop consistent for bipolar/unipolar RRAMs, which can comprehensively gradual abrupt transitions, as many during processes. These include reverse set (reset failure), gentle process...

10.1109/ted.2024.3384140 article EN IEEE Transactions on Electron Devices 2024-04-08

Selectors are critical components for reducing the sneak path leakage currents in emerging resistive random-access memory (RRAM) arrays. Two-dimensional (2D) materials provide a rich choice of with van der Waals stacking to form heterostructure selectors controllable energy barriers. Here, we experimentally demonstrate 2D-material-based exponential current-voltage (

10.1021/acsnano.4c09421 article EN ACS Nano 2024-10-04
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