- Optical Coherence Tomography Applications
- Advanced Fiber Optic Sensors
- Digital Holography and Microscopy
- Silicon Nanostructures and Photoluminescence
- Advanced Surface Polishing Techniques
- Advanced Fluorescence Microscopy Techniques
- Laser Material Processing Techniques
- Advanced Electron Microscopy Techniques and Applications
- Optical measurement and interference techniques
- Surface Roughness and Optical Measurements
- Advanced Measurement and Metrology Techniques
- Image Processing Techniques and Applications
- Semiconductor materials and devices
- Advanced X-ray and CT Imaging
- Electrowetting and Microfluidic Technologies
- Anodic Oxide Films and Nanostructures
- Near-Field Optical Microscopy
- Photoacoustic and Ultrasonic Imaging
- Microfluidic and Bio-sensing Technologies
- Advanced machining processes and optimization
- Laser-induced spectroscopy and plasma
- Nuclear Physics and Applications
- Electrical and Bioimpedance Tomography
Instituto de Física del Litoral
2022-2025
Consejo Nacional de Investigaciones Científicas y Técnicas
2022-2024
National Technological University
2018-2021
A high-speed interferometric system was developed to analyze nanostructured porous silicon (PS) membranes by measuring reflectance variations during capillary filling from both sides. camera employed capture the evolution of entire sample area with necessary temporal resolution, providing quantitative information on dynamics. By integrating these data a simple fluid dynamic model, it is possible examine internal structure and determine effective pore radii profiles along their thickness. The...
The use of nanoporous structures with known morphology allows studying the properties fluids in conditions strong spatial confinement. Alternatively, capillary filling simple provides information on their morphology. When a liquid enters porous structure there is an increase optical path layer, and measuring this as function position time evaluating dynamics pores. In work, we determined nanostructured silicon (PS) by coherence tomography. high resolution technique one not only to follow...
Optical coherence tomography (OCT) is a non-destructive optical technique, which uses light source with wide band width that focuses on point in the sample to determine distance (strictly, path difference, OPD) between this and reference surface. The can be superficial or at an interior interface of (transparent semitransparent), allowing topographies / tomographies different materials. Michelson interferometer traditional experimental scheme for beam divided into two arms, one other sample....
In this work, we implemented an off-axis digital holographic microscopy (DHM) setup to study the behavior of liquid drops on nanostructured porous silicon (PS) membranes. When a comes into contact with PS structure, capillary action and surface tension give rise imbibition intricate volume pores. At same time, vapor field developed around drop enhances condensation evaporation from The complex interplay between these phenomena (capillary driven internal flows, condensation, evaporation) is...
We report the implementation of lensless off-axis digital holographic microscopy as a non-destructive optical analyzer for nano-scale structures. The measurement capacity system was validated by analyzing topography metallic grid with ≈150nm thick opaque features. In addition, an experimental configuration self-reference included to study dynamics capillary filling phenomena in nanostructured porous silicon. fluid front position function time extracted from holograms, and typical square root...
La Fundación Gutenberg, a través del Instituto Argentino de Artes Gráficas, y el Grupo Fotónica Aplicada la Facultad Regional Delta, Universidad Tecnológica Nacional, se asociaron para trabajar en conjunto desarrollo una nueva técnica óptica ser aplicada caracterización materiales impresos. En este marco, llevó adelante un proyecto tecnológico social (PDTS) que orientó aplicación tomografía coherencia óptica, tintas recubrimientos, sobre diferentes sustratos flexibles, principalmente...
We report the implementation of lensless off-axis digital holographic microscopy as a non-destructive optical analyzer for nano-scale structures. The measurement capacity system was validated by analyzing topography metallic grid with ≈150nm thick opaque features. In addition, an experimental configuration self-reference included to study dynamics capillary filling phenomena in nanostructured porous silicon. fluid front position function time extracted from holograms, and typical square root...