G Campbell

ORCID: 0009-0003-3396-325X
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About
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Research Areas
  • Electron and X-Ray Spectroscopy Techniques
  • Advanced Materials Characterization Techniques
  • Advanced Electron Microscopy Techniques and Applications
  • Force Microscopy Techniques and Applications
  • Microstructure and mechanical properties
  • High-Velocity Impact and Material Behavior
  • Solidification and crystal growth phenomena
  • nanoparticles nucleation surface interactions
  • Integrated Circuits and Semiconductor Failure Analysis
  • Aluminum Alloy Microstructure Properties
  • Additive Manufacturing Materials and Processes
  • Ion-surface interactions and analysis
  • Phase-change materials and chalcogenides
  • Machine Learning in Materials Science
  • Metal and Thin Film Mechanics
  • Microstructure and Mechanical Properties of Steels
  • Chalcogenide Semiconductor Thin Films
  • Advancements in Photolithography Techniques
  • Nuclear Materials and Properties
  • Advanced ceramic materials synthesis
  • Anodic Oxide Films and Nanostructures
  • Surface and Thin Film Phenomena
  • Non-Destructive Testing Techniques
  • Cold Fusion and Nuclear Reactions
  • Radiation Shielding Materials Analysis

Lawrence Livermore National Laboratory
2008-2024

University of California System
2006

College Station Medical Center
2006

AT&T (United States)
2003

Heidelberg (Poland)
1993

Winston-Salem/Forsyth County Schools
1993

Langley Research Center
1988

A dynamic transmission electron microscope (DTEM) has been designed and implemented to study structural dynamics in condensed matter systems. The DTEM is a conventional situ (TEM) modified drive material processes with nanosecond laser, “pump” pulse measure it shortly afterward 30-ns-long probe of ∼107 electrons. An image resolution <20nm may be obtained single pulse, largely eliminating the need average multiple measurements enabling unique, irreversible events nanosecond-...

10.1063/1.2236263 article EN Applied Physics Letters 2006-07-24

Properties of fragmentation from an explosively driven 316L stainless steel spherical shell section fabricated by a laser powder bed additive manufacturing process with minimal surface finishing are investigated. This is insensitive high explosive, resulting in strain rate deformation (>8 × 103 s−1) and failure the steel. Photonic Doppler velocimetry measures expansion rate; dynamic radiography high-speed imaging capture fracture behavior The response additively manufactured compared...

10.1063/5.0170223 article EN cc-by Journal of Applied Physics 2023-10-18

High-purity tantalum single crystal cylinders oriented with [011] parallel to the cylinder axis were deformed 10, 20, and 30 percent in compression. The samples took on an ellipsoidal shape during testing, elongated along [100] direction almost no dimensional change [011]. Two orthogonal sectioning planes selected for characterization using Orientation Imaging Microscopy (OIM): one plane containing (longitudinal) other (transverse). OIM revealed patterns of alternating rotations that develop...

10.1115/1.2812364 article EN Journal of Engineering Materials and Technology 1999-04-01

Extract HTML view is not available for this content. However, as you have access to content, a full PDF via the ‘Save PDF’ action button. Extended abstract of paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4,

10.1017/s1431927605510079 article EN Microscopy and Microanalysis 2005-08-01

We consider the nature of faults in dissociated 9R phase at an incoherent twin boundary copper. Analysis dislocation content a five-layer break normal ABC/BCA/CAB stacking sequence shows that this defect is associated with secondary grain (SGBD) Burgers vector a/6[211]. Atomistic simulations SGBDs interface show sign important to determining core structure dislocation. The resulting atomistic structures and width fault can be directly understood by analyzing set twinning dislocations make up...

10.4028/www.scientific.net/msf.294-296.35 article EN Materials science forum 1998-11-01

Extract Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – 9,

10.1017/s1431927607079068 article EN Microscopy and Microanalysis 2007-08-01

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3,

10.1017/s1431927606063586 article EN Microscopy and Microanalysis 2006-07-31

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – 8, 2013.

10.1017/s1431927613007769 article EN Microscopy and Microanalysis 2013-08-01

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – 5, 2010.

10.1017/s1431927610055224 article EN Microscopy and Microanalysis 2010-07-01

The authors present some important technical advantages that can be realized by implementing fiber optics aboard ships. They emphasize the problem of cable clutter ships and weight reduction gained through copper cables. also describe a new shipboard fiber-optic series designed to meet recently published US Navy specifications.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

10.1109/milcom.1989.103932 article EN 2003-01-13

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3,

10.1017/s1431927606063926 article EN Microscopy and Microanalysis 2006-07-31

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

10.1017/s1431927606066372 article EN Microscopy and Microanalysis 2006-07-31

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

10.1017/s1431927611003400 article EN Microscopy and Microanalysis 2011-07-01

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

10.1017/s1431927612004084 article EN Microscopy and Microanalysis 2012-07-01

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – 30,

10.1017/s1431927609093635 article EN Microscopy and Microanalysis 2009-07-01

Extract Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – 9,

10.1017/s1431927607073606 article EN Microscopy and Microanalysis 2007-08-01

Extract HTML view is not available for this content. However, as you have access to content, a full PDF via the ‘Save PDF’ action button. Extended abstract of paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4,

10.1017/s1431927605507955 article EN Microscopy and Microanalysis 2005-08-01
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