A5103009100- Anomaly Detection Techniques and Applications
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Hội Gastroenterology Việt Nam
2023-2024
Can Tho University
2024
Hanoi University of Science and Technology
2022-2024
Hanoi National University of Education
2024
Ho Chi Minh City Medicine and Pharmacy University
2022
University of Transport and Communications
2021
Tien Giang General Hospital
2020
Tra Vinh University
2019
GlobalFoundries (United States)
2016-2018
Ho Chi Minh City University of Technology
2017
Previous chapter Next Full AccessProceedings Proceedings of the 2013 SIAM International Conference on Data Mining (SDM)CMI: An Information-Theoretic Contrast Measure for Enhancing Subspace Cluster and Outlier DetectionHoang Vu Nguyen, Emmanuel Müller, Jilles Vreeken, Fabian Keller, Klemens BöhmHoang Böhmpp.198 - 206Chapter DOI:https://doi.org/10.1137/1.9781611972832.22PDFBibTexSections ToolsAdd to favoritesExport CitationTrack CitationsEmail SectionsAboutAbstract In many real world...
In many real-world applications, data is collected in multi-dimensional spaces. However, not all dimensions are relevant for analysis. Instead, interesting knowledge hidden correlated subsets of (i.e., subspaces the original space). Detecting these independent underlying mining task an open research problem. It challenging due to exponential search space. Existing methods have tried tackle this by utilizing Apriori schemes. they show poor scalability and miss high quality subspaces. This...
Facial anthropometrics are measurements of human faces and important figures that used in many different fields, such as cosmetic surgery, protective gear design, reconstruction, etc. Therefore, the first procedure is to extract facial landmarks, then carried out by professional devices or based on experience. The aim this review provide an update 3D measurements, nasal reconstruction literature. novel methods detect landmarks including non-deep deep learning also introduced paper. Moreover,...
Semiconductor manufacturing of 14 nm devices has presented numerous engineering and challenges from newly introduced FinFETs in the FEOL to double patterned trenches self-aligned vias BEOL. Voids are a common defect found metal interconnects BEOL any technology, more generally occurring thinner pitch size copper wires. manifest themselves many forms like line voids, island seam end point etc., depending on location, orientation mechanism occurrence. Small process marginality between CuMn...
In a database, besides known dependencies among columns (e.g., foreign key and primary constraints), there are many other correlations unknown to the database users. Extraction of such hidden is be useful for various tasks in optimization data analytics. However, task challenging due lack measures quantify column correlations. Correlations may exist different types value domains, which makes techniques based on matching inapplicable. Besides, have multiple semantics, does not allow disjoint...
Different tool platforms are used in conjunction for patterned wafer inspection like 9xxx & 29xx provided by KLA Tencor. Depending on the sensitivity throughput requirements, a chip fabrication plant mixes and matches inline strategies to ensure early detection of defects chip, which could cause yield loss or reliability problems. This paper discusses use novel concept high strategy using tool. is achieved unique combination Broad-Band light with Dark Field Apertures. application can be...
As the scaling continues and industry moves to sub 1× nm nodes, Defect Review Scanning Electron Microscopy (DR-SEM) faces increasingly difficult challenges. The Defects of Interest (DOI) shrink as features shrinks leading imaging difficulty purely based on scale. defect signal gets immersed in noise challenge separating false from true is larger than ever. Also, more complex analysis required for DOIs with 3D morphology previous layer DOI. A smart approach DR-SEM must be adopted which allows...
As the scaling continues and industry moves to sub 1× nm nodes, Defect Review Scanning Electron Microscopy (DR-SEM) faces increasingly difficult challenges. The Defects of Interest (DOI) shrink as features shrinks leading imaging difficulty purely based on scale. defect signal gets immersed in noise challenge separating false from true is larger than ever. Also, more complex analysis required for DOIs with 3D morphology previous layer DOI. A smart approach DR-SEM must be adopted which allows...
Based on the recent success of Low-Rank matrix Representation (LRR), we propose a novel classification method for robust face recognition, named LRR-based Classification (LRRC). By ideal that if each data class is linearly spanned by subspace unknown dimensions and are noiseless, lowest-rank representations set test vector samples with respect to training have nature being both dense within-class affinity almost zero between-class affinities. Consequently, LRR exactly reveals data. Our...
Ge0.07GaN films were successfully made on Si (100), SiO2/Si (100) substrates by a radio frequency reactive sputtering technique at various deposition conditions listed as range of 100–400 °C and 90–150 W with single ceramic target containing 7 % dopant Ge. The results showed that different RF power heating temperature affected the structural, electrical optical properties sputtered films. as-deposited had an structural polycrystalline. GeGaN distorted structure under growth conditions....