- Fuel Cells and Related Materials
- Semiconductor materials and devices
- Advanced Battery Technologies Research
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Electric and Hybrid Vehicle Technologies
Taiwan Semiconductor Manufacturing Company (China)
2024
South China University of Technology
2023
Fe contamination has always been one of the most critical issues in integrated circuit (IC) industry due to its catastrophic effect on device reliability and electrical characteristics. With complementary metal oxide semiconductor (CMOS) technology scaling down, this issue attracting more attention. In paper, impact impurity gate integrity (GOI) advanced CMOS is investigated. Intentional polysilicon gates was conducted both boron- phosphorus-doped devices. Failure analysis with...
Supercapacitors are new types of electrical energy storage components with an electric double layer. Ageing characteristics, lifetime and reliability evaluation great significance for quality rational use. This paper focused on the pseudo-failure calendar distribution supercapacitors. High-temperature accelerated ageing test supercapacitors is carried out, equivalent series resistance capacitance were tested. Pseudo-lifetime calculated fitted. Fitting results showed that pseudo-lifetime more...