Min-Su Kim

ORCID: 0009-0005-6845-9752
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About
Contact & Profiles
Research Areas
  • Semiconductor materials and devices
  • Advancements in Battery Materials
  • Ferroelectric and Piezoelectric Materials
  • Advanced Memory and Neural Computing
  • Ferroelectric and Negative Capacitance Devices
  • MXene and MAX Phase Materials
  • Electron and X-Ray Spectroscopy Techniques
  • Acoustic Wave Resonator Technologies
  • Electronic and Structural Properties of Oxides
  • Multiferroics and related materials

Pohang University of Science and Technology
2023-2024

Improving the structural stability of high-capacity high-Ni cathodes through doping has been investigated, but stabilization mechanisms dopants remain unclear. This study focused on unraveling influence individual dopants, Aluminium, Titanium, or Zirconium, cathodes. X-ray Diffraction and High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy (HAADF-STEM) were employed for quantitative analysis cation mixing, first time, HAADF-STEM deep learning combined to improve accuracy...

10.1016/j.cej.2024.148869 article EN cc-by-nc-nd Chemical Engineering Journal 2024-01-19

Topological textures of ferroelectric polarizations have promise as alternative devices for future information technology. A polarization rotation inevitably deviates from the stable orientation in axial ferroelectrics, but local energy losses compromise global symmetry, resulting a distorted shape topological vortex or inhibiting vortex. Easy planar isotropy helps to promote rotating structures and, accordingly, facilitate access nontrivial textures. Here, we investigate domain structure an...

10.1021/acs.nanolett.3c01009 article EN Nano Letters 2023-05-08

The discovery of ferroelectricity in hafnium oxide (HfO 2 ) [1] has driven great advances memory applications ferroelectrics over the past decade, with its stable a reduced dimension and high CMOS compatibility.To elucidate novel physical phenomena ferroelectric HfO , both experimental theoretical efforts have been made, including Integrated, Precession-Assisted, Analytical 4D-STEM Visit us learn more about our TESCAN TENSOR info.tescan.

10.1093/micmic/ozad067.942 article EN Microscopy and Microanalysis 2023-07-22
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