Baolei Cheng

ORCID: 0000-0001-9479-8372
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About
Contact & Profiles
Research Areas
  • Interconnection Networks and Systems
  • Software-Defined Networks and 5G
  • Advanced Optical Network Technologies
  • Advanced Graph Theory Research
  • Advancements in Semiconductor Devices and Circuit Design
  • Semiconductor materials and devices
  • Cloud Computing and Resource Management
  • Caching and Content Delivery
  • Parallel Computing and Optimization Techniques
  • Peer-to-Peer Network Technologies
  • Distributed systems and fault tolerance
  • Silicon Carbide Semiconductor Technologies
  • Radiation Effects in Electronics
  • Graph theory and applications
  • VLSI and FPGA Design Techniques
  • Complex Network Analysis Techniques
  • Embedded Systems Design Techniques
  • Ferroelectric and Negative Capacitance Devices
  • Graphene research and applications
  • Graph Theory and Algorithms
  • DNA and Biological Computing
  • Cooperative Communication and Network Coding
  • graph theory and CDMA systems
  • Optimization and Packing Problems
  • VLSI and Analog Circuit Testing

Soochow University
2015-2024

Xiamen University of Technology
2023

Novelis (Canada)
2016

Hohai University
2012

National Aviation University
2009

Motorola (United States)
1999-2002

University of California, Los Angeles
1996-1999

Colorado School of Mines
1999

Tsinghua University
1998

The potential impact of high-/spl kappa/ gate dielectrics on device short-channel performance is studied over a wide range dielectric permittivities using two-dimensional (2-D) simulator implemented with quantum mechanical models. It found that the degradation caused by fringing fields from to source/drain regions. These in regions further induce electric channel which weakens control. thickness-to-length aspect ratio proper parameter quantify percentage field and thus short degradation. In...

10.1109/16.772508 article EN IEEE Transactions on Electron Devices 1999-07-01

10.1016/j.dam.2016.11.019 article EN publisher-specific-oa Discrete Applied Mathematics 2016-12-23

Abstract Connectivity is a classic measure for reliability of multiprocessor system in the case processor failures. Extra connectivity and component are two important indicators presence failing processors. The $h$-extra $\kappa _{h}(G)$ graph $G$ minimum number nodes whose removal will disconnect $G$, every remaining has at least $h+1$ nodes. Moreover, $h$-component $c\kappa deletion results with $h$ components. However, extra many well-known networks have been independently investigated....

10.1093/comjnl/bxz136 article EN The Computer Journal 2020-02-10

10.1109/iceict57916.2023.10245026 article EN 2022 IEEE 5th International Conference on Electronic Information and Communication Technology (ICEICT) 2023-07-21

A set of spanning trees T <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1</sub> ; xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> ;. .. Tk in a network G are Completely Independent Spanning Trees (CISTs) if for any two nodes u and v V (G), the paths between have no common edges internal nodes. CISTs important applications data center networks, such as fault-tolerant multi-node broadcasting, one-to-all reliable secure message distribution,...

10.1109/tpds.2020.3029654 article EN IEEE Transactions on Parallel and Distributed Systems 2020-10-08

The generalized hypercube (GH) is one key interconnection network with excellent topological properties. It contains many other topologies, such as the network, complete graph, mesh and k-ary n-cube network. can also be used to construct some data center networks, HyperX, BCube, FBFLY, SWCube. However, construction cost of GH high since it too links. In this paper, we propose a novel low architecture called exchanged (EGH). We study properties EGH, number edges, degree vertices,...

10.1109/tpds.2019.2941207 article EN IEEE Transactions on Parallel and Distributed Systems 2019-09-13

Single halo p-MOSFETs with channel lengths down to 100 nm are optimized, fabricated, and characterized as part of this study. We show extensive device characterization results study the effect large angle V/sub T/ adjust implant parameters on performance hot carrier reliability. Results both conventionally doped single have been presented for comparison purposes.

10.1109/ted.2002.1003752 article EN IEEE Transactions on Electron Devices 2002-06-01

In recent years, there are many new findings on independent spanning trees (ISTs for short) in hypercubes, crossed cubes, locally twisted and Mobius which all belong to a more general network category called bijective connection networks (BC networks). However, little progress has been made ISTs BC networks. this paper, we first propose the definitions of conditional V -dimensional-permutation. We then give linear parallel algorithm rooted at an arbitrary vertex networks, include based...

10.1109/tpds.2014.2307871 article EN IEEE Transactions on Parallel and Distributed Systems 2014-02-24

We explore four different technology and design options for transistors library cells a low power supply voltage of 0.4 V circuit statistics representative artificial intelligence (AI) applications. The rules correspond to 2nm node with cell heights 100~110 nm 30 gate pitch. Holistic analysis the RO (Ring Oscillator) behavior, including MOL parasitics, all major variability sources, stress proximity effects suggests that FinFET nanoslab transistor exhibit wide range performance differences....

10.23919/vlsit.2019.8776478 article EN Symposium on VLSI Technology 2019-06-01

Fault-tolerance is an important parameter to measure the performance of a network. However, most works only consider fault single vertex and ignore structure-fault The generalized hypercube G(mr,mr−1,…,m1) one key interconnection network with excellent topological properties. In this paper, we study H-structure fault-tolerance by studying its connectivity H-substructure for H∈{K1,M,C3,C4,K4}⁠. Since can be used construct some data center networks, such as BCube, HyperX, FBFLY, results in...

10.1093/comjnl/bxz023 article EN The Computer Journal 2019-03-01
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