Heuristics to aid the derivation of small test sets that detect single stuck-at faults in combinational logic circuits are proposed. The heuristics can be added existing pattern generators without compromising fault coverage. Experimental results obtained by adding proposed a simple PODEM procedure and applying it ISCAS-85 fully-scanned ISCAS-89 benchmark presented substantiate effectiveness heuristics. >

Heuristics to aid the derivation of small test sets that detect single stuck-at faults in combinational logic circuits are proposed. The heuristics can be added existing pattern generators without compromising fault coverage. Experimental results obtained by adding proposed a simple PODEM procedure and applying it ISCAS-85 fully-scanned ISCAS-89 benchmark presented substantiate effectiveness heuristics.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML"...

Industry routers are very complex and time consuming, becoming more so with the explosion in design rules for manufacturability requirements that multiply each technology node. Global routing is just first phase of a router serves dual purpose (i) seeding following phases (ii) evaluating whether current point routable. Lately, it has become common to use "light mode" version global router, similar today's academic routers, quickly evaluate routability given placement. This model suffers from...

As the semiconductor process technology advances into sub-10nm regime, cell pin accessibility, which is a complex joint effect from shape and nearby blockages, becomes main cause for DRC violations. Therefore, machine learning model hotspot prediction needs to consider both very high-resolution patterns low-resolution layout information as input features. A new convolutional neural network technique, J-Net, introduced with mixed resolution This customized architecture that flexible handling...

With larger chip images and increasingly aggressive technologies, key design processes must interoperate, PDS, a physical-synthesis system, accomplishes technology closure through interacting of logic optimization, placement, timing, clock insertion, routing, all using common infrastructure with robust variable-accuracy analysis abstractions.

In this paper, the authors consider problem of reducing test set sizes for single stuck-at faults in combinational logic circuits. They report on an alternative to conventional reverse order fault simulation, called compaction (ROTCO). The proposed procedure processes a obtained by existing generator, with sim size. Unlike allows vectors be changed increase flexibility detecting detected earlier vectors, thereby potentially removing tests that cannot removed simulation. Experimental results...

Article Free Access Share on Transformational placement and synthesis Authors: Wilm Donath IBM TJ Watson Research Center, Yorktown Heights HeightsView Profile , Prabhakar Kudva Leon Stok Lakshmi Reddy Server Group, Hopewell Junction, NY NYView Andrew Sullivan Kanad Chakraborty Paul Villarrubia Austin, TX TXView Authors Info & Claims DATE '00: Proceedings of the conference Design, automation test in EuropeJanuary 2000 Pages 194–201https://doi.org/10.1145/343647.343732Online:01 January...

We report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. the fraction of faults are resolved, comparable to better than those reported previously in literature. No preprocessing is required amount memory needed less 100 bytes per gate. The low requirements high performance have been achieved by working a larger but simpler search space, simplifying decision making backtracking using...

The problem of generating small (compact) test sets for single transition and CMOS stuck-open faults in combinational logic circuits is considered. In addition, it proposed that to generate cover a wide range physical defects, set detect different models should be derived. Specifically, the comprehensive addressed by considering fault together. A dynamic compaction technique two-pattern tests proposed. exploits strategies developed stuck-at faults, performs vector overlap derive sets....

A fault simulator for path delay faults in synchronous sequential circuits is described, where a test sequence considered under different combinations of slow and fast clock cycles (clocking schemes). The features the are: (1) multiple clocking schemes used application given are parallel, allowing simulation sequence, to obtain highest coverage achieveable by every sequence; (2) during process, it possible determine scheme so as minimize number be with without compromising coverage; (3)...

The authors consider the problem of test generation for synchronous sequential circuits case where no hardware reset is available, and show that initialization not a necessary requirement practical generator. They present procedure gate-level which based on multiple observation time units fault-free sequences, they sequences can be found by this in cases conventional generators fail to find tests due their failure initialize circuit. Experimental results ISCAS-89 benchmark are presented...

A symmetric-function fan-in tree (SFFT) is a fanout-free cone of logic that computes symmetric function, so all the leaf nets in its support set are commutative. Such trees frequently found designs, especially when design originated as two-level logic.These usually created during synthesis, there no knowledge locations root or source gates nets. Because this, large SFFTs present challenge to placement algorithms. The result placements generally far from optimal, leading wiring congestion,...

This paper presents an incremental timing-driven placement tool, named OWARU. It optimizes timing critical paths through a free space-aware path smoothing: the gates on such are relocated to spaces around smoothed paths, while static analysis is involved accurately assess changes due relocation. OWARU extended accommodate gate sizing and layer assignment demonstrate effectiveness of unified physical synthesis optimizations placement. The goal show that ideal platform for closure at later...

Routing congestion has become a critical layout challenge in nanoscale circuits since it is factor determining the routability of design. An unroutable design not useful even though closes on all other metrics. Fast closure can only be achieved by accurately evaluating whether routable or early cycle. Lately, common to use “light mode” version global router quickly evaluate given placement. This approach suffers from three weaknesses: (i) does adequately model local routing resources, which...

In the IC industry, chip design cycles are becoming more compressed, while designs themselves growing in complexity. These trends necessitate efficient methods to handle late-stage engineering change orders (ECOs) functional specification, often response errors discovered after much of implementation is finished. Past ECO synthesis algorithms have typically treated ECOs as and applied error diagnosis techniques solve them. However, primarily geared towards finding a single change, moreover,...

Interconnect optimization, including buffer insertion and Steiner tree construction, continues to be a pillar technology that largely determines overall chip performance. Buffer algorithms in published literature are mostly focused on optimizing only the most critical path. This is sensible approach for first order effect. As people strive squeeze out more performance post Moore's law era, timing of near paths worth considering as well. In this work, p-norm based Figure Of Merit (pFOM)...

EDA tools provide a large spectrum of parameters to help designers achieve the maximized PPA designs. The corresponding enormous solution space, however, hinders from navigating towards optimal solutions. In this paper, we propose multi-stage automatic flow tuning tool, named FlowTuner, for efficient and effective parameter VLSI design flow. It utilizes both exploitation using transferred knowledge archival data exploration via cooperative co-evolutionary framework. Furthermore, novel...

Automated design space exploration has become a promising approach for improving VLSI quality and achieving balance across range of closure objectives. However, it comes with the challenge high compute resource cost in terms CPU runtime, disk space, memory requirements. This paper proposes an automated early scenario pruning (ESP) scheme that predicts results synthesis scenarios at stages runs. Scenarios deemed non-competitive objective functions can be pruned prior to completion under...

In the IC industry, chip design cycles are becoming more compressed, while designs themselves growing in complexity. These trends necessitate efficient methods to handle late-stage engineering change orders (ECOs) functional specification, often response errors discovered after much of implementation is finished. Past ECO synthesis algorithms have typically treated ECOs as and applied error diagnosis techniques solve them. However, primarily geared towards finding a single change, moreover,...

In this paper, we consider the problem of generating small (compact) test sets for single transition and CMOS stuck-open faults in combinational logic circuits. addition, propose that to generate cover a wide range physical defects, set detect different models should be derived. Specifically, address comprehensive by considering fault together. We dynamic compaction technique two-pattern tests, which exploits strategies developed stuck-at faults, performs vector overlap derive sets. present...

A new electronic ballast circuit for High Intensity Discharge (HID) lamps to achieve an "ultra" high efficiency of 95% is proposed In this paper. The first stage the which Is power factor correction boost converter has demonstrated >97% using SI MOSFET as switch. second ballast, a DC frequency Inverter been designed >98% efficiency. Thus overall expected be >95%. performance "ultra high" efficient when SIC MOSFETS are used discussed loss model developed compare Si or SiC devices.

A novel technique to significantly improve the performance of a design by movement sets gates during or after timing driven placement is proposed. method identify optimal set circuit (gate) movements enhance presented. Experimental results with min-cut tool indicate that proposed approach direct manipulation locations, improves large partitions chip.

The scale of technology node increases power-density dynamically. Various techniques are proposed to reduce the power consumption. One approach is Dual-Supply Voltage (DSV). DSV apply a lower supply voltage on selected non-critical gates for saving while maintaining chip performance at same time. In order facilitate design in DSV, grouped form islands. [21] presents flow generate and place However, after relocating islands, original placement changed timing might become worse. this paper, we...