A5103277981- Advanced X-ray Imaging Techniques
- Advanced Electron Microscopy Techniques and Applications
- Electron and X-Ray Spectroscopy Techniques
- Microstructure and mechanical properties
- Metallic Glasses and Amorphous Alloys
- Pediatric Urology and Nephrology Studies
- Medical Imaging Techniques and Applications
- Magnetic properties of thin films
- MRI in cancer diagnosis
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced X-ray and CT Imaging
- Advancements in Photolithography Techniques
- Advanced Surface Polishing Techniques
- Force Microscopy Techniques and Applications
- Surface Roughness and Optical Measurements
- Metal and Thin Film Mechanics
- Advanced Materials Characterization Techniques
- Aluminum Alloy Microstructure Properties
- Microstructure and Mechanical Properties of Steels
- Aluminum Alloys Composites Properties
- Anodic Oxide Films and Nanostructures
- Nuclear Physics and Applications
- Surface and Thin Film Phenomena
- Phase-change materials and chalcogenides
- Elasticity and Material Modeling
Humboldt-Universität zu Berlin
2019-2024
Lawrence Berkeley National Laboratory
2016-2021
University of California, Berkeley
2016-2021
Molecular Foundry
2019-2021
Humboldt State University
2021
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct detector, it is now possible record full 2D image the diffracted beam at each probe position, typically grid positions. These 4D-STEM datasets are rich in information, including signatures local structure, orientation, deformation, electromagnetic fields other sample-dependent properties. However,...
Abstract To date, there has not yet been a direct observation of the initiation and propagation individual defects in metallic glasses during deformation at nanoscale. Here, we show through combination situ nanobeam electron diffraction large-scale molecular dynamics simulations that can directly observe changes to local short medium range atomic ordering formation shear band. We experimentally spatially resolved reduction order prior banding due increased strain. compare this simulations,...
Abstract We present a method that lowers the dose required for an electron ptychographic reconstruction by adaptively scanning specimen, thereby providing spatial information redundancy in regions of highest importance. The proposed is built upon deep learning model trained reinforcement learning, using prior knowledge specimen structure from training data sets. show adaptive ptychography outperforms alternative low-dose experiments terms resolution and quality.
The local elastic strains during tensile deformation in a CuZrAlAg metallic glass are obtained by fitting an elliptic shape function to the characteristic amorphous ring electron diffraction patterns. Scanning nanobeam enables strain mapping with resolution of few nanometers. Here, fast direct detector is used acquire patterns at sufficient speed map transient continuous loading situ transmission microscope. direction was found increase loading. After catastrophic fracture, residual that...
The overdetermination of the mathematical problem underlying ptychography is reduced by a host experimentally more desirable settings. Furthermore, reconstruction sample-induced phase shift typically limited uncertainty in experimental parameters and finite sample thicknesses. Presented conjugate gradient descent algorithm, regularized optimization for (ROP), that recovers partially known along with shift, improves resolution incorporating multislice formalism to treat thicknesses, includes...
Summary Gallium‐based focused ion beams generated from liquid–metal sources are widely used in micromachining and sample preparation for transmission electron microscopy, with well‐known drawbacks such as damage contamination. In this work, an alternative (neon) beam by a gas field‐ionization source is evaluated the of electron‐transparent specimens. To do so, sections Si Al alloy prepared both Ga Ne direct comparison. Diffraction‐contrast imaging energy dispersive x‐ray spectroscopy to...
High-throughput grain mapping with sub-nanometer spatial resolution is demonstrated using scanning nanobeam electron diffraction (also known as 4D transmission microscopy, or 4D-STEM) combined high-speed direct-electron detection. An probe size down to 0.5 nm in diameter used and the sample investigated a gold–palladium nanoparticle catalyst. Computational analysis of 4D-STEM data sets performed disk registration algorithm identify peaks followed by feature learning map individual grains....
Abstract Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale three dimensions. We present a reconstruction algorithm that takes as input focal series four-dimensional scanning transmission (4D-STEM) data. apply approach lead iridate, PbIrO, and yttrium-stabilized zirconia, YZrO, heterostructure from data acquired with specimen single plan-view orientation, epitaxial layers stacked along beam...
A detailed analysis of ptychography for three-dimensional (3D) phase reconstructions thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality 3D along beam direction through higher overdetermination ratio. This method compared with established multi-slice techniques, such as conventional regularized and multi-mode ptychography. Additionally, we contrast an alternative that uses virtual optical sectioning...
Journal Article Comparison of Compression Methods for Ptychographic Reconstructions through Decomposition the Diffraction Patterns in Orthonormal Bases Get access Anton Gladyshev, Gladyshev Humboldt-Universität zu Berlin, Institut für Physik & IRIS Adlershof, Germany Search other works by this author on: Oxford Academic Google Scholar Marcel Schloz, Schloz Thomas C Pekin, Pekin Christoph T Koch Corresponding author: christoph.koch@hu-berlin.de Microscopy and Microanalysis, Volume 28, Issue...
Journal Article Towards Ptychography with Structured Illumination, and a Derivative-Based Reconstruction Algorithm Get access W Van den Broek, Broek Institut für Physik & IRIS Adlershof, Humboldt-Universität zu Berlin, Germany Corresponding author: vandenbroek@physik.hu-berlin.de Search for other works by this author on: Oxford Academic Google Scholar M Schloz, Schloz TC Pekin, Pekin PM Pelz, Pelz Max Planck Institute the Structure Dynamics of Matter, Center Free Electron Laser Science,...
A detailed analysis of ptychography for 3D phase reconstructions thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality along beam direction through higher overdetermination ratio. This method compared with established multi-slice techniques, such as conventional regularized and multi-mode ptychography. Additionally, we contrast an alternative that uses virtual optical sectioning reconstructed scattering matrix...
An abstract is not available for this content so a preview has been provided. As you have access to content, full PDF via the ‘Save PDF’ action button.
An abstract is not available for this content so a preview has been provided. As you have access to content, full PDF via the 'Save PDF' action button.
An abstract is not available for this content so a preview has been provided. As you have access to content, full PDF via the ‘Save PDF’ action button.
Focused ion beam (FIB) milling is a widely-used technique for transmission electron microscopy (TEM) sample preparation [1].FIB-based of TEM samples offers number unique capabilities, including site-specific over wide size regime nanometers to many microns and also the ability thin inhomogeneous with high precision [2].Coupled micromanipulators beam-assisted material deposition, modern commercial FIBs can prepare electron-transparent sections analysis from virtually any system [3]- [5].All...
Journal Article Probing Crystalline Defects Using an EBSD-Based Virtual Dark-Field Method Get access Shiteng Zhao, Zhao National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley Laboratory, Berkeley, CA, USADepartment of Materials Science & Engineering, University California, USA Search other works by this author on: Oxford Academic Google Scholar Ruopeng Zhang, Zhang Thomas Pekin, Pekin Department Physics, Humboldt-Universität zu Berlin, Germany Andrew M Minor...
Journal Article High Resolution Three-Dimensional Reconstructions in Electron Microscopy Through Multifocus Ptychography Get access Marcel Schloz, Schloz Humboldt Universität zu Berlin, Institut für Physik & IRIS Adlershof, Germany Corresponding author: schlozma@hu-berlin.de Search for other works by this author on: Oxford Academic Google Scholar Thomas C Pekin, Pekin Hamish G Brown, Brown National Center Microscopy, Molecular Foundry, Lawrence Berkeley Laboratory, Berkeley, California...
Journal Article ab initio Electrostatic Potentials for 4D-STEM Ptychographic Reconstruction Get access Jacob Madsen, Madsen University of Vienna, Faculty Physics, Austria Search other works by this author on: Oxford Academic Google Scholar Christoph Hofer, Hofer Electron Microscopy Materials Science (EMAT), Antwerp, Belgium Thomas C Pekin, Pekin Humboldt-Universität zu Berlin, Institut für Physik & IRIS, Adlershof, Germany Marcel Schloz, Schloz Thuy An Bui, Bui Koch, Koch Timothy J...