A5066228604- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- Advanced Electron Microscopy Techniques and Applications
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Nanowire Synthesis and Applications
- Electronic and Structural Properties of Oxides
- Magnetic properties of thin films
- 2D Materials and Applications
- Thermal properties of materials
- Magnetic Properties and Applications
- Characterization and Applications of Magnetic Nanoparticles
- Graphene research and applications
- Force Microscopy Techniques and Applications
Commissariat à l'Énergie Atomique et aux Énergies Alternatives
2019-2022
Université Grenoble Alpes
2019-2022
CEA LETI
2020-2022
CEA Grenoble
2019-2022
Henry Royce Institute
2020
University of Manchester
2019-2020
Institut polytechnique de Grenoble
2019
Liquid- phase exfoliation (LPE) is the principal method of producing two-dimensional (2D) materials such as graphene in large quantities with a good balance between quality and cost now widely adopted by both academic industrial sectors. The fragmentation mechanisms involved have usually been simply attributed to force induced ultrasound interaction solvent molecules. Nonetheless, little known about how they actually occur, i.e., thick graphite crystals can be exfoliated into thin small...
The electric field in a silicon p–n junction has been measured using pixelated scanning transmission electron microscopy. By convergence angle of 3.2 mrad, spatial resolution better than 1 nm can be achieved leading to rigid shift the transmitted beam as it passes through an field. precessing around optical axis at 0.1°, effects dynamical diffraction reduced. This leads improved measurement from beam. Different algorithms have used measure this shift, and template matching more accurate...
Perpendicular Shape Anisotropy based storage layer offers a bulk anisotropy much more robust against thermal fluctuations than the interfacial anisotropy, allowing to reduce temperature dependence of coercivity sub-20 nm MTJ cells.
Transmission electron microscope (TEM) specimen preparation by focused ion beam (FIB) milling requires delicate polishing of a thin window material during the final stages procedure. Over or underpolishing is common and extra resources to correct. Despite some methods for lamella thickness measurement being available, majority users judge step subjectively from scanning (SEM) images acquired between steps. Here we demonstrate successful determination silicon lamellae using calibrated...
A silicon p-n junction has been mapped using electron beam induced current in both a scanning transmission microscope (STEM) and conventional (SEM). In STEM, the of higher energy through thin specimen leads to better spatial resolution more uniform interaction volume than can be achieved SEM. Better is also TEM specimens as diffusion lengths minority carriers are much lower measured bulk material due proximity surfaces. We further demonstrate that positive fixed surface charge favors...
Journal Article In-Situ EBIC STEM: Automated Quantification Get access Grigore Moldovan, Moldovan point electronic GmbH, Halle (Saale), Saxony-Anhalt, Germany Search for other works by this author on: Oxford Academic Google Scholar Aidan P Conlan, Conlan Univ. Grenoble Alpes, CEA, LETI, Grenoble, France Corresponding author: grigore.moldovan@pointelectronic.de David Cooper Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 1718–1719,...
Here, we use electron beam induced current (EBIC) in a scanning transmission microscope to characterize the structure and electronic properties of Al/SiGe Al/Si-rich/SiGe axial nanowire heterostructures fabricated by thermal propagation Al SiGe nanowire. The two behave as Schottky contacts with different barrier heights. From sign collected at contacts, intrinsic semiconductor doping is determined be n-type. Furthermore, find that silicon-rich double interface presents lower height than...