Joan Vila‐Comamala

ORCID: 0000-0002-1543-3146
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About
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Research Areas
  • Advanced X-ray Imaging Techniques
  • Advanced Electron Microscopy Techniques and Applications
  • X-ray Spectroscopy and Fluorescence Analysis
  • Laser-Plasma Interactions and Diagnostics
  • Advancements in Photolithography Techniques
  • Crystallography and Radiation Phenomena
  • Advanced X-ray and CT Imaging
  • Diamond and Carbon-based Materials Research
  • Force Microscopy Techniques and Applications
  • Electron and X-Ray Spectroscopy Techniques
  • Advanced Surface Polishing Techniques
  • Nuclear Physics and Applications
  • Optical Coatings and Gratings
  • Medical Imaging Techniques and Applications
  • Digital Holography and Microscopy
  • Electronic and Structural Properties of Oxides
  • Particle Accelerators and Free-Electron Lasers
  • Nanofabrication and Lithography Techniques
  • Astrophysical Phenomena and Observations
  • Nanowire Synthesis and Applications
  • Optical measurement and interference techniques
  • Semiconductor materials and devices
  • Photorefractive and Nonlinear Optics
  • Thin-Film Transistor Technologies
  • Microstructure and mechanical properties

Paul Scherrer Institute
2016-2025

Swiss Light Source
2023

Institute for Biomedical Engineering
2017-2021

ETH Zurich
2017-2021

Diamond Light Source
2014-2019

Diamond Materials (United States)
2017

Argonne National Laboratory
2011-2015

Oxfam
2014

European Synchrotron Radiation Facility
2011

University of Helsinki
2011

Accurate knowledge of translation positions is essential in ptychography to achieve a good image quality and the diffraction limited resolution. We propose method retrieve correct position errors during reconstruction iterations. Sub-pixel accuracy after refinement shown be achievable within several tens Simulation experimental results for both optical X-ray wavelengths are given. The improves retrieved object relaxes requirement while acquiring patterns.

10.1364/oe.21.013592 article EN cc-by Optics Express 2013-05-30

Abstract Phase retrieval is a long-standing problem in imaging when only the intensity of wavefield can be recorded. Coherent diffraction lensless technique that uses iterative algorithms to recover amplitude and phase contrast images from data. For general samples, single-diffraction pattern has been an algorithmic experimental challenge. Here we report method known modulation sample exit wave. This coherent removes inherent ambiguities reliable, rapidly converging algorithm involving three...

10.1038/ncomms13367 article EN cc-by Nature Communications 2016-11-18

We have employed ptychographic coherent diffractive imaging to completely characterize the focal spot wavefield and wavefront aberrations of a high-resolution X-ray lens.The data from strongly scattering object was acquired using radiation cone emanating coherently illuminated Fresnel zone plate at photon energy 6.2 keV.Reconstructed images were retrieved with spatial resolution 8 nm by combining difference-map phase retrieval algorithm non-linear optimization refinement.By numerically...

10.1364/oe.19.021333 article EN cc-by Optics Express 2011-10-12

A method for the fabrication of ultrahigh-resolution Fresnel zone plate lenses x-ray microscopy is demonstrated. It based on deposition a material (Ir) onto sidewalls prepatterned template structure (Si) using an atomic layer technique. This results in doubling effective density, thus improving achievable resolution microscopes. Test structures with lines and spaces down to 15 nm were resolved scanning transmission microscope at 1 keV photon energy.

10.1103/physrevlett.99.264801 article EN Physical Review Letters 2007-12-28

The electrodeposition of metallic lithium is a major cause failure in batteries. 3D microstructure electrodeposited 'moss' liquid electrolytes has been characterised at sub-micron resolution for the first time. Using synchrotron X-ray phase contrast imaging we distinguish mossy microstructures from high surface area salt formations by their contrasting attenuation.

10.1039/c4cc03187c article EN Chemical Communications 2014-05-20

A growing number of X-ray sources based on the free-electron laser (XFEL) principle are presently under construction or have recently started operation. The intense, ultrashort pulses these will enable new insights in many different fields science. key problem is to provide x-ray optical elements capable collecting largest possible fraction radiation and focus into smallest focus. As a step towards this goal, we demonstrate here first nanofocusing hard XFEL pulses. We developed diamond...

10.1038/srep00057 article EN cc-by-nc-sa Scientific Reports 2011-08-08

Synchrotron-based full-field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100-nm barrier is reached and trespassed only by few instruments, mainly in soft x-ray regime. We present an x-ray, microscope with capabilities operating at 10 keV of 144 nm. Custom-designed optical components allow ideal, aperture-matched sample illumination very sensitive phase contrast...

10.1103/physrevb.81.140105 article EN Physical Review B 2010-04-20

We have used coherent X-ray diffraction experiments to characterize both the 1-D and 2-D foci produced by nanofocusing Kirkpatrick-Baez (K-B) mirrors, we find agreement.Algorithms related ptychography were obtain a 3-D reconstruction of focused hard beam waist, using data measured when mirrors not optimally aligned.Considerable astigmatism was evident in reconstructed complex wavefield.Comparing wavefield for single mirror with geometrical projection wavefront errors expected from optical...

10.1364/oe.18.023420 article EN cc-by Optics Express 2010-10-22

We demonstrate how the spatial-frequency spectrum of x-ray illumination affects reconstruction signal-to-noise ratio and resolution ptychographic imaging. The a focused probe is enhanced by partially clipping beam with an aperture near its focus. This approach presents simple way enhancing without demanding extra efforts in optics fabrication, we experimentally that it provides improvement image quality resolution.

10.1103/physrevb.86.100103 article EN Physical Review B 2012-09-24

X-ray microscopy based on Fresnel zone plates is a powerful technique for sub-100 nm resolution imaging of biological and inorganic materials. Here, we report the modeling, fabrication characterization zone-doubled multi-keV regime (4-12 keV). We demonstrate unprecedented spatial by resolving 15 lines spaces in scanning transmission microscopy, focusing diffraction efficiencies 7.5% at 6.2 keV photon energy. These developments represent significant step towards 10 hard energies up to 12 keV.

10.1364/oe.19.000175 article EN cc-by Optics Express 2010-12-22

Due to the ability of 100 keV electrons penetrate deep into resist with little scattering, we were able directly write various dense and high aspect ratio nanostructures in 540 nm 1.1 microm thick layers poly(methyl methacrylate) (PMMA) resist. The PMMA molds produced by electron beam lithography developed using a contrast developer. used transfer pattern metallic filling trenches Au electroplating. By exposing lines narrower than target width, observed improved process latitude line width...

10.1088/0957-4484/21/29/295303 article EN Nanotechnology 2010-07-05

The fabrication and characterization of Fresnel zone plates (FZPs) for hard X-ray microscopy applications are reported. High-quality 500 nm- 1 µm-thick Au FZPs with outermost widths down to 50 nm 70 nm, respectively, diameters up 600 µm were fabricated. diffraction efficiencies the fabricated measured a wide range energies (2.8-13.2 keV) showing excellent values 65-75% theoretical values, reflecting good quality FZPs. Spatially resolved efficiency measurements indicate uniformity defect-free...

10.1107/s0909049511002366 article EN cc-by Journal of Synchrotron Radiation 2011-03-09

High aspect ratio nanostructuring requires high precision pattern transfer with highly directional etching. In this work, we demonstrate the fabrication of structures ultra-high ratios (up to 10 000 : 1) in nanoscale regime (down nm) by platinum assisted chemical etching silicon gas phase. The is created a vapour water diluted hydrofluoric acid and continuous air flow, which works both as an oxidizer carrier for reactive species. reactivity catalyst formation silicide improve stability allow...

10.1039/c9nh00709a article EN cc-by-nc Nanoscale Horizons 2020-01-01

Diffractive and refractive optical elements have become an integral part of most high-resolution X-ray microscopes. However, they suffer from inherent chromatic aberration. This has to date restricted their use narrow-bandwidth radiation, essentially limiting such microscopes high-brightness synchrotron sources. Similar visible light optics, one way tackle aberration is by combining a focusing defocusing optic with different dispersive powers. Here, we present the first successful...

10.1038/s41467-022-28902-8 article EN cc-by Nature Communications 2022-03-14

Full-field transmission X-ray microscopy is a unique non-destructive technique for three-dimensional imaging of specimens at the nanometer scale. Here, use zone-doubled Fresnel zone plates to achieve spatial resolution better than 20 nm in hard regime (8–10 keV) reported. By obtaining tomographic reconstruction Ni/YSZ solid-oxide fuel cell, feasibility performing scientifically relevant samples using such high-spatial-resolution demonstrated.

10.1107/s0909049512029640 article EN cc-by Journal of Synchrotron Radiation 2012-07-28

High-contrast, high-resolution imaging of biomedical specimens is indispensable for studying organ function and pathologies. Conventional histology, the gold standard soft-tissue visualization, limited by its anisotropic spatial resolution, elaborate sample preparation, lack quantitative image information. X-ray absorption or phase tomography have been identified as promising alternatives enabling non-destructive, distortion-free three-dimensional (3D) imaging. However, reaching sufficient...

10.1364/optica.399421 article EN cc-by Optica 2020-08-06

Diffractive optics play a key role in hard X‐rays imaging for which many scientific, technological, and biomedical applications exist. Herein, high‐aspect‐ratio microfabrication of gratings X‐ray interferometry is demonstrated using Pt as catalyst the metal assisted chemical etching Si solution HF H 2 O . The layer thermally treated to realize porous that stabilizes pattern with pitch size from 4.8 20 μm direction perpendicular <100> substrate an aspect ratio up 60:1. superior...

10.1002/adem.202000258 article EN Advanced Engineering Materials 2020-06-05

We present a systematic investigation of the optical response to circularly polarized illumination in twisted stacked plasmonic nanostructures. The system consissts two identical, parallel gold triskelia centrally aligned and rotated at central angle relative each other. Sample fabrication was acomplished through double electron beam lithograpy process. This stack holds modes multipolar character near-infrared range, showing strong dependence their excitation intensities on handedness...

10.48550/arxiv.2501.14547 preprint EN arXiv (Cornell University) 2025-01-24

Abstract Many neutron techniques can greatly benefit from enhanced lenses for focusing and imaging. In this work, we revisit the potential of diffractive optics beams, building on advanced high-resolution nano-lithography developed fabrication X-ray used at synchrotron facilities. We demonstrate state-of-the-art nickel silicon Fresnel zone plates report proof-of-concept experiments full-field microscopy small angle scattering. The advancement will open new opportunities techniques, improving...

10.1038/s41598-025-92329-6 article EN cc-by Scientific Reports 2025-03-11

The cross section of an InAs nanowire with a diameter 150 nm epitaxially grown on 111-oriented InP substrate was characterized using combination x-ray scanning microdiffraction and coherent diffraction imaging. Using beam focused by Fresnel zone plate, we were able to scan in real space hence localize single nanowires the as-grown epitaxial state. For one nanowire, three-dimensional intensity distribution reciprocal mapped around (111) reflection. phase retrieval algorithms, wire...

10.1103/physrevb.79.125324 article EN Physical Review B 2009-03-27

We have characterized the x-ray phase vortices generated at focal spot of various spiral Fresnel zone plates with an outermost width Δr=50 nm. The complex-valued wavefields as small 50 nm in size (FWHM) and several topological charges were reconstructed using ptychographic coherent diffractive imaging. spots demonstrate good agreement theoretically expected diffraction-limited focusing.

10.1364/ol.39.005281 article EN Optics Letters 2014-09-03

Novel X-ray imaging of structural domains in a ferroelectric epitaxial thin film using diffraction contrast is presented. The full-field hard microscope uses the surface scattering signal, reflectivity or experiment, to spatially resolve local structure with 70 nm lateral spatial resolution and sub-nanometer height sensitivity. Sub-second exposures can be used acquire 14 µm × image an effective pixel size 20 on sample. optical configuration various engineering considerations that are...

10.1107/s1600577514016555 article EN Journal of Synchrotron Radiation 2014-10-02
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